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@inproceedings{DBLP:conf/itc/LaisneCPKSTRZ22,
  author       = {Michael Laisne and
                  Alfred L. Crouch and
                  Michele Portolan and
                  Martin Keim and
                  Hans Martin von Staudt and
                  Bradford G. Van Treuren and
                  Jeff Rearick and
                  Songlin Zuo},
  title        = {{IEEE} {P1687.1:} Extending the Network Boundaries for Test},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {382--390},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00084},
  doi          = {10.1109/ITC50671.2022.00084},
  timestamp    = {Thu, 05 Jan 2023 13:13:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneCPKSTRZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/StaudtEWPC22,
  author       = {Hans Martin von Staudt and
                  Luai Tarek Elnawawy and
                  Sarah Wang and
                  Larry Ping and
                  Jung Woo Choi},
  title        = {Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED
                  Headlamp Driver {IC}},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {365--371},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00045},
  doi          = {10.1109/ITC50671.2022.00045},
  timestamp    = {Thu, 05 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/StaudtEWPC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/StaudtSBCHC22,
  author       = {Hans Martin von Staudt and
                  Franz Schuler and
                  Rohitaswa Bhattacharya and
                  Justin Wei{-}Lin Cheng and
                  Cheng{-}Da Huang and
                  Parker Chih{-}Chun Chen},
  title        = {High-Coverage DfT and Reliability Enhancements for Automotive Floating
                  Gate {OTP} Beyond {AEC-Q100}},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {637--641},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00088},
  doi          = {10.1109/ITC50671.2022.00088},
  timestamp    = {Thu, 05 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/StaudtSBCHC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/StaudtTRPK21,
  author       = {Hans Martin von Staudt and
                  Bradford G. Van Treuren and
                  Jeff Rearick and
                  Michele Portolan and
                  Martin Keim},
  title        = {Exploring and Comparing {IEEE} {P1687.1} and {IEEE} 1687 Modeling
                  of Non-TAP Interfaces},
  booktitle    = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium,
                  May 24-28, 2021},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ETS50041.2021.9465438},
  doi          = {10.1109/ETS50041.2021.9465438},
  timestamp    = {Fri, 02 Jul 2021 14:14:26 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/StaudtTRPK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LaisneCPKSATR20,
  author       = {Mike Laisne and
                  Alfred L. Crouch and
                  Michele Portolan and
                  Martin Keim and
                  Hans Martin von Staudt and
                  M. Abdalwahab and
                  Bradford G. Van Treuren and
                  Jeff Rearick},
  title        = {Modeling Novel Non-JTAG {IEEE} 1687-Like Architectures},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325248},
  doi          = {10.1109/ITC44778.2020.9325248},
  timestamp    = {Mon, 25 Jan 2021 08:44:58 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneCPKSATR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/StaudtBRL20,
  author       = {Hans Martin von Staudt and
                  Mohamed Anas Benhebibi and
                  Jeff Rearick and
                  Michael Laisne},
  title        = {Industrial Application of {IJTAG} Standards to the Test of Big-A/little-d
                  devices},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
                  USA, November 1-6, 2020},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC44778.2020.9325267},
  doi          = {10.1109/ITC44778.2020.9325267},
  timestamp    = {Mon, 25 Jan 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/StaudtBRL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/RearickCS19,
  author       = {Jeff Rearick and
                  Alfred L. Crouch and
                  Hans Martin von Staudt},
  title        = {Innovative Practices on {IEEE} 1687.xyz},
  booktitle    = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VTS.2019.8758629},
  doi          = {10.1109/VTS.2019.8758629},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/RearickCS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/StaudtMTK19,
  author       = {Hans Martin von Staudt and
                  Amit Majumdar and
                  Bill Taylor and
                  Jennifer Kitchen},
  title        = {Innovative Design for Test in State-of-the-Art Analog Systems},
  booktitle    = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA,
                  April 23-25, 2019},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/VTS.2019.8758607},
  doi          = {10.1109/VTS.2019.8758607},
  timestamp    = {Thu, 18 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/StaudtMTK19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LaisneSBE17,
  author       = {Michael Laisne and
                  Hans Martin von Staudt and
                  Sourabh Bhalerao and
                  Mark Eason},
  title        = {Single-pin test control for Big A, little {D} devices},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242069},
  doi          = {10.1109/TEST.2017.8242069},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/LaisneSBE17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SpangSW07,
  author       = {Oliver Spang and
                  Hans Martin von Staudt and
                  Michael G. Wahl},
  editor       = {Rudy Lauwereins and
                  Jan Madsen},
  title        = {A sophisticated memory test engine for {LCD} display drivers},
  booktitle    = {2007 Design, Automation and Test in Europe Conference and Exposition,
                  {DATE} 2007, Nice, France, April 16-20, 2007},
  pages        = {213--218},
  publisher    = {{EDA} Consortium, San Jose, CA, {USA}},
  year         = {2007},
  url          = {https://doi.org/10.1109/DATE.2007.364593},
  doi          = {10.1109/DATE.2007.364593},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/SpangSW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ddecs/VockFS06,
  author       = {Stefan Vock and
                  Ulrich Flogaus and
                  Hans Martin von Staudt},
  editor       = {Matteo Sonza Reorda and
                  Ondrej Nov{\'{a}}k and
                  Bernd Straube and
                  Hana Kub{\'{a}}tov{\'{a}} and
                  Zdenek Kot{\'{a}}sek and
                  Pavel Kubal{\'{\i}}k and
                  Raimund Ubar and
                  Jir{\'{\i}} Bucek},
  title        = {Productivity and Code Quality Improvement of Mixed-Signal Test Software
                  by Applying Software Engineering Methods},
  booktitle    = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics
                  of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech
                  Republic, April 18-21, 2006},
  pages        = {136--140},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/DDECS.2006.1649593},
  doi          = {10.1109/DDECS.2006.1649593},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ddecs/VockFS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/VockSS06,
  author       = {Stefan Vock and
                  Markus Schmid and
                  Hans Martin von Staudt},
  editor       = {Scott Davidson and
                  Anne Gattiker},
  title        = {Test Software Generation Productivity and Code Quality Improvement
                  by applying Software Engineering Techniques},
  booktitle    = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara,
                  CA, USA, October 22-27, 2006},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/TEST.2006.297652},
  doi          = {10.1109/TEST.2006.297652},
  timestamp    = {Tue, 12 Dec 2023 09:46:27 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VockSS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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