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@inproceedings{DBLP:conf/irps/KozakSLZLSZ22,
  author       = {Joseph P. Kozak and
                  Qihao Song and
                  Jingcun Liu and
                  Ruizhe Zhang and
                  Qiang Li and
                  Wataru Saito and
                  Yuhao Zhang},
  title        = {Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {22--1},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764463},
  doi          = {10.1109/IRPS48227.2022.9764463},
  timestamp    = {Mon, 09 May 2022 18:11:24 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KozakSLZLSZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/SongKMLZVSSSZ22,
  author       = {Qihao Song and
                  Joseph P. Kozak and
                  Yunwei Ma and
                  Jingcun Liu and
                  Ruizhe Zhang and
                  Roman Volkov and
                  Daniel Sherman and
                  Kurt V. Smith and
                  Wataru Saito and
                  Yuhao Zhang},
  title        = {GaN MIS-HEMTs in Repetitive Overvoltage Switching: Parametric Shift
                  and Recovery},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {10},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764548},
  doi          = {10.1109/IRPS48227.2022.9764548},
  timestamp    = {Tue, 10 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SongKMLZVSSSZ22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/KozakS0LZ21,
  author       = {Joseph P. Kozak and
                  Qihao Song and
                  Ruizhe Zhang and
                  Jingcun Liu and
                  Yuhao Zhang},
  title        = {Robustness of GaN Gate Injection Transistors under Repetitive Surge
                  Energy and Overvoltage},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405173},
  doi          = {10.1109/IRPS46558.2021.9405173},
  timestamp    = {Wed, 05 May 2021 11:53:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KozakS0LZ21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/Song0KLLZ21,
  author       = {Qihao Song and
                  Ruizhe Zhang and
                  Joseph P. Kozak and
                  Jingcun Liu and
                  Qiang Li and
                  Yuhao Zhang},
  title        = {Failure Mechanisms of Cascode GaN HEMTs Under Overvoltage and Surge
                  Energy Events},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405208},
  doi          = {10.1109/IRPS46558.2021.9405208},
  timestamp    = {Wed, 05 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/Song0KLLZ21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/KozakZLNZ20,
  author       = {Joseph P. Kozak and
                  Ruizhe Zhang and
                  Jingcun Liu and
                  Khai D. T. Ngo and
                  Yuhao Zhang},
  title        = {Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and
                  Overcurrent Switching},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128330},
  doi          = {10.1109/IRPS45951.2020.9128330},
  timestamp    = {Fri, 06 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/KozakZLNZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/ZhangKLXZ20,
  author       = {Ruizhe Zhang and
                  Joseph P. Kozak and
                  Jingcun Liu and
                  Ming Xiao and
                  Yuhao Zhang},
  title        = {Surge Energy Robustness of GaN Gate Injection Transistors},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9129324},
  doi          = {10.1109/IRPS45951.2020.9129324},
  timestamp    = {Fri, 06 Nov 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/ZhangKLXZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}