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export results for "Low cost at-speed testing using On-Product Clock Generation compatible with test compression."

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@inproceedings{DBLP:conf/itc/KellerCFCMSILG10,
  author       = {Brion L. Keller and
                  Krishna Chakravadhanula and
                  Brian Foutz and
                  Vivek Chickermane and
                  R. Malneedi and
                  Thomas J. Snethen and
                  Vikram Iyengar and
                  David E. Lackey and
                  Gary Grise},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Low cost at-speed testing using On-Product Clock Generation compatible
                  with test compression},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {724--733},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699276},
  doi          = {10.1109/TEST.2010.5699276},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KellerCFCMSILG10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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