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export results for "MIV Fault Modeling Method Based on Finite Element Analysis."

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@inproceedings{DBLP:conf/icta3/Xiao0021,
  author       = {Ziwen Xiao and
                  Zhiming Yang and
                  Yang Yu},
  title        = {{MIV} Fault Modeling Method Based on Finite Element Analysis},
  booktitle    = {2021 {IEEE} International Conference on Integrated Circuits, Technologies
                  and Applications, {ICTA} 2021, Zhuhai, China, November 24-26, 2021},
  pages        = {149--152},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ICTA53157.2021.9661873},
  doi          = {10.1109/ICTA53157.2021.9661873},
  timestamp    = {Mon, 06 Nov 2023 08:19:56 +0100},
  biburl       = {https://dblp.org/rec/conf/icta3/Xiao0021.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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