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@article{DBLP:journals/mr/BoostandoostGP17,
  author       = {Mahyar Boostandoost and
                  Dieter Gr{\"{a}}fje and
                  Florin Pop},
  title        = {Circuit simulation assisting Physical Fault Isolation for effective
                  root cause analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {194--200},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.074},
  doi          = {10.1016/J.MICROREL.2017.07.074},
  timestamp    = {Wed, 23 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BoostandoostGP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BoostandoostKB10,
  author       = {Mahyar Boostandoost and
                  Uwe Kerst and
                  Christian Boit},
  title        = {Extraction of local thin-film solar cell parameters by bias-dependent
                  {IR-LBIC}},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1899--1902},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.060},
  doi          = {10.1016/J.MICROREL.2010.07.060},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BoostandoostKB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}