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@inproceedings{DBLP:conf/irps/NaritaKISMYKTKKUKSNIWKO23,
  author       = {Tetsuo Narita and
                  Daigo Kikuta and
                  Kenji Ito and
                  Tomoyuki Shoji and
                  Tomohiko Mori and
                  Satoshi Yamaguchi and
                  Yasuji Kimoto and
                  Kazuyoshi Tomita and
                  Masakazu Kanechika and
                  Takeshi Kondo and
                  Tsutomu Uesugi and
                  Jun Kojima and
                  Jun Suda and
                  Yoshitaka Nagasato and
                  Satoshi Ikeda and
                  Hiroki Watanabe and
                  Masayoshi Kosaki and
                  Tohru Oka},
  title        = {Reliability issues of gate oxides and {\textdollar}p-n{\textdollar}
                  junctions for vertical GaN metal-oxide-semiconductor field-effect
                  transistors (Invited)},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10118047},
  doi          = {10.1109/IRPS48203.2023.10118047},
  timestamp    = {Wed, 24 May 2023 09:43:44 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/NaritaKISMYKTKKUKSNIWKO23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/jssc/KubosawaHATAASS99,
  author       = {Hajime Kubosawa and
                  Naoshi Higaki and
                  Satoshi Ando and
                  Hiromasa Takahashi and
                  Yoshimi Asada and
                  Hideaki Anbutsu and
                  Tomio Sato and
                  Masato Sakate and
                  Atsuhiro Suga and
                  Michihide Kimura and
                  Hideo Miyake and
                  Hiroshi Okano and
                  Akira Asato and
                  Yasunori Kimura and
                  Hiroshi Nakayama and
                  Masayoshi Kimoto and
                  Katsuji Hirochi and
                  Hideki Saito and
                  Norio Kaido and
                  Yukihiro Nakagawa and
                  Toshio Shimada},
  title        = {A 2.5-GFLOPS, 6.5 million polygons per second, four-way {VLIW} geometry
                  processor with {SIMD} instructions and a software bypass mechanism},
  journal      = {{IEEE} J. Solid State Circuits},
  volume       = {34},
  number       = {11},
  pages        = {1619--1626},
  year         = {1999},
  url          = {https://doi.org/10.1109/4.799871},
  doi          = {10.1109/4.799871},
  timestamp    = {Thu, 07 Jul 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/jssc/KubosawaHATAASS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}