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export results for "Measurement Analysis and Fault Proneness Indication in Product Line Applications (PLA)."

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@inproceedings{DBLP:conf/somet/Ahmed07,
  author       = {Zeeshan Ahmed},
  editor       = {Hamido Fujita and
                  Domenico M. Pisanelli},
  title        = {Measurement Analysis and Fault Proneness Indication in Product Line
                  Applications {(PLA)}},
  booktitle    = {New Trends in Software Methodologies, Tools and Techniques - Proceedings
                  of the Sixth SoMeT 2007, November 7-9, 2007, Rome, Italy},
  series       = {Frontiers in Artificial Intelligence and Applications},
  volume       = {161},
  pages        = {391--400},
  publisher    = {{IOS} Press},
  year         = {2007},
  url          = {http://www.booksonline.iospress.nl/Content/View.aspx?piid=7280},
  timestamp    = {Wed, 14 Mar 2012 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/somet/Ahmed07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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