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@inproceedings{DBLP:conf/asicon/HiramotoSMSKHFW19,
  author       = {Toshiro Hiramoto and
                  Katsumi Satoh and
                  Tomoko Matsudai and
                  Wataru Saito and
                  Kuniyuki Kakushima and
                  Takuya Hoshii and
                  Kazuyoshi Furukawa and
                  Masahiro Watanabe and
                  Naoyuki Shigyo and
                  Hitoshi Wakabayashi and
                  Kazuo Tsutsui and
                  Hiroshi Iwai and
                  Atsushi Ogura and
                  Shinichi Nishizawa and
                  Ichiro Omura and
                  Hiromichi Ohashi and
                  Kazuo Itou and
                  Toshihiro Takakura and
                  Munetoshi Fukui and
                  Shinichi Suzuki and
                  Ken Takeuchi and
                  Masanori Tsukuda and
                  Yohichiroh Numasawa},
  title        = {Switching of 3300V Scaled {IGBT} by 5V Gate Drive},
  booktitle    = {13th {IEEE} International Conference on ASIC, {ASICON} 2019, Chongqing,
                  China, October 29 - November 1, 2019},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ASICON47005.2019.8983633},
  doi          = {10.1109/ASICON47005.2019.8983633},
  timestamp    = {Wed, 21 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/asicon/HiramotoSMSKHFW19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/HoshiiFKWSSTIFS18,
  author       = {Takuya Hoshii and
                  Kazuyoshi Furukawa and
                  Kuniyuki Kakushima and
                  Masahiro Watanabe and
                  Naoyuki Shigvo and
                  Takuya Saraya and
                  Toshihiko Takakura and
                  Kazuo Itou and
                  Munetoshi Fukui and
                  Shinichi Suzuki and
                  Kiyoshi Takeuchi and
                  Iriya Muneta and
                  Hitoshi Wakabayashi and
                  Shinichi Nishizawa and
                  Kazuo Tsutsui and
                  Toshiro Hiramoto and
                  Hiromichi Ohashi and
                  Hiroshi Lwai},
  title        = {Verification of the Injection Enhancement Effect in IGBTs by Measuring
                  the Electron and Hole Currents Separately},
  booktitle    = {48th European Solid-State Device Research Conference, {ESSDERC} 2018,
                  Dresden, Germany, September 3-6, 2018},
  pages        = {26--29},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ESSDERC.2018.8486870},
  doi          = {10.1109/ESSDERC.2018.8486870},
  timestamp    = {Tue, 20 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/HoshiiFKWSSTIFS18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/FukuiNF12,
  author       = {Munetoshi Fukui and
                  Yasuhiko Nara and
                  Junichi Fuse},
  title        = {Characteristics Variability Evaluation of Actual {LSI} Transistors
                  with Nanoprobing},
  booktitle    = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
                  19-22, 2012},
  pages        = {4},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/ATS.2012.80},
  doi          = {10.1109/ATS.2012.80},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/FukuiNF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}