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export results for "Open faults in BiCMOS gates."

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@article{DBLP:journals/tcad/MaM95,
  author       = {Siyad C. Ma and
                  Edward J. McCluskey},
  title        = {Open faults in BiCMOS gates},
  journal      = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.},
  volume       = {14},
  number       = {5},
  pages        = {567--575},
  year         = {1995},
  url          = {https://doi.org/10.1109/43.384417},
  doi          = {10.1109/43.384417},
  timestamp    = {Thu, 24 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcad/MaM95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/MaM94,
  author       = {Siyad C. Ma and
                  Edward J. McCluskey},
  title        = {Open faults in BiCMOS gates},
  booktitle    = {12th {IEEE} {VLSI} Test Symposium (VTS'94), April 25-28, 1994, Cherry
                  Hill, New Jersey, {USA}},
  pages        = {434--439},
  publisher    = {{IEEE} Computer Society},
  year         = {1994},
  url          = {https://doi.org/10.1109/VTEST.1994.292277},
  doi          = {10.1109/VTEST.1994.292277},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/MaM94.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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