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export results for "Reliability improvement of high value doped polysilicon-based resistors."

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@article{DBLP:journals/mr/CarvouBSRBRGR02,
  author       = {E. Carvou and
                  F. Le Bihan and
                  Anne Claire Sala{\"{u}}n and
                  R. Rogel and
                  Olivier Bonnaud and
                  Yannick Rey{-}Tauriac and
                  Xavier Gagnard and
                  L. Roland},
  title        = {Reliability improvement of high value doped polysilicon-based resistors},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1369--1372},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00151-8},
  doi          = {10.1016/S0026-2714(02)00151-8},
  timestamp    = {Fri, 25 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CarvouBSRBRGR02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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