Search dblp for Publications

export results for "Reliability of 28nm embedded RRAM for consumer and industrial products."

 download as .bib file

@inproceedings{DBLP:conf/imw2/PetersAHO22,
  author       = {Christian Peters and
                  Frank Adler and
                  Karl Hofmann and
                  Jan Otterstedt},
  title        = {Reliability of 28nm embedded {RRAM} for consumer and industrial products},
  booktitle    = {{IEEE} International Memory Workshop, {IMW} 2022, Dresden, Germany,
                  May 15-18, 2022},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IMW52921.2022.9779300},
  doi          = {10.1109/IMW52921.2022.9779300},
  timestamp    = {Fri, 16 Jun 2023 10:03:33 +0200},
  biburl       = {https://dblp.org/rec/conf/imw2/PetersAHO22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.