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@inproceedings{DBLP:conf/icicdt/Kieu-Do-NguyenK22,
  author       = {Binh Kieu{-}Do{-}Nguyen and
                  Tuan{-}Kiet Dang and
                  Trong{-}Thuc Hoang and
                  Katsumi Inoue and
                  Toshinori Usugi and
                  Masanori Odaka and
                  Shuichi Kameyama and
                  Cong{-}Kha Pham},
  title        = {High-speed FPGA-based Design and Implementation of Text Search Processor},
  booktitle    = {International Conference on {IC} Design and Technology, {ICICDT} 2022,
                  Hanoi, Vietnam, September 21-23, 2022},
  pages        = {109--112},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICICDT56182.2022.9933111},
  doi          = {10.1109/ICICDT56182.2022.9933111},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icicdt/Kieu-Do-NguyenK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/gcce/NunohiroAK21,
  author       = {Shohei Nunohiro and
                  Takumi Asada and
                  Shuichi Kameyama},
  title        = {Travel Time Estimation for Ambulances based on a Smartphone and Car-mounted
                  Camera Survey},
  booktitle    = {10th {IEEE} Global Conference on Consumer Electronics, {GCCE} 2021,
                  Kyoto, Japan, October 12-15, 2021},
  pages        = {526--527},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/GCCE53005.2021.9621958},
  doi          = {10.1109/GCCE53005.2021.9621958},
  timestamp    = {Fri, 03 Dec 2021 08:37:30 +0100},
  biburl       = {https://dblp.org/rec/conf/gcce/NunohiroAK21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/HigamiFSKT11,
  author       = {Yoshinobu Higami and
                  Hiroshi Furutani and
                  Takao Sakai and
                  Shuichi Kameyama and
                  Hiroshi Takahashi},
  title        = {Test Pattern Selection for Defect-Aware Test},
  booktitle    = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
                  Delhi, India, November 20-23, 2011},
  pages        = {102--107},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/ATS.2011.24},
  doi          = {10.1109/ATS.2011.24},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HigamiFSKT11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ParkerKD11,
  author       = {Kenneth P. Parker and
                  Shuichi Kameyama and
                  David Dubberke},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Surviving state disruptions caused by test: {A} case study},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139140},
  doi          = {10.1109/TEST.2011.6139140},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ParkerKD11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KameyamaOET92,
  author       = {Shuichi Kameyama and
                  Hideyuki Ohara and
                  Chihiro Endo and
                  Naoki Takayama},
  title        = {Interconnect and Delay Testing with a 4800-Pin Board Tester},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {338--344},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527841},
  doi          = {10.1109/TEST.1992.527841},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KameyamaOET92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}