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export results for "Statistical variability in FinFET devices with intrinsic parameter fluctuations."

 download as .bib file

@article{DBLP:journals/mr/HwangLH10,
  author       = {Chih{-}Hong Hwang and
                  Yiming Li and
                  Ming{-}Hung Han},
  title        = {Statistical variability in FinFET devices with intrinsic parameter
                  fluctuations},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {5},
  pages        = {635--638},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.01.041},
  doi          = {10.1016/J.MICROREL.2010.01.041},
  timestamp    = {Fri, 24 Feb 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HwangLH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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