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export results for "Topic-based defect prediction."

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@inproceedings{DBLP:conf/icse/NguyenNP11,
  author       = {Tung Thanh Nguyen and
                  Tien N. Nguyen and
                  Tu Minh Phuong},
  editor       = {Richard N. Taylor and
                  Harald C. Gall and
                  Nenad Medvidovic},
  title        = {Topic-based defect prediction},
  booktitle    = {Proceedings of the 33rd International Conference on Software Engineering,
                  {ICSE} 2011, Waikiki, Honolulu , HI, USA, May 21-28, 2011},
  pages        = {932--935},
  publisher    = {{ACM}},
  year         = {2011},
  url          = {https://doi.org/10.1145/1985793.1985950},
  doi          = {10.1145/1985793.1985950},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/icse/NguyenNP11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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