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export results for "Utilization of SECDED for soft error and variation-induced defect tolerance in caches."

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@inproceedings{DBLP:conf/date/HungIGS07,
  author       = {Luong Dinh Hung and
                  Hidetsugu Irie and
                  Masahiro Goshima and
                  Shuichi Sakai},
  editor       = {Rudy Lauwereins and
                  Jan Madsen},
  title        = {Utilization of {SECDED} for soft error and variation-induced defect
                  tolerance in caches},
  booktitle    = {2007 Design, Automation and Test in Europe Conference and Exposition,
                  {DATE} 2007, Nice, France, April 16-20, 2007},
  pages        = {1134--1139},
  publisher    = {{EDA} Consortium, San Jose, CA, {USA}},
  year         = {2007},
  url          = {https://dl.acm.org/citation.cfm?id=1266612},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/HungIGS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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