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@article{DBLP:journals/mj/KimPKPCSSKT18,
  author       = {Min Suk Kim and
                  Markondeya Raj Pulugurtha and
                  Youngwoo Kim and
                  Gapyeol Park and
                  Kyungjun Cho and
                  Vanessa Smet and
                  Venky Sundaram and
                  Joungho Kim and
                  Rao R. Tummala},
  title        = {Miniaturized and high-performance {RF} packages with ultra-thin glass
                  substrates},
  journal      = {Microelectron. J.},
  volume       = {77},
  pages        = {66--72},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.mejo.2018.05.002},
  doi          = {10.1016/J.MEJO.2018.05.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mj/KimPKPCSSKT18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tie/SmetFHRR13,
  author       = {Vanessa Smet and
                  Fran{\c{c}}ois Forest and
                  Jean{-}Jacques Huselstein and
                  Amgad Rashed and
                  Fr{\'{e}}d{\'{e}}ric Richardeau},
  title        = {Evaluation of V\({}_{\mbox{\emph{ce}}}\) Monitoring as a Real-Time
                  Method to Estimate Aging of Bond Wire-IGBT Modules Stressed by Power
                  Cycling},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {60},
  number       = {7},
  pages        = {2760--2770},
  year         = {2013},
  url          = {https://doi.org/10.1109/TIE.2012.2196894},
  doi          = {10.1109/TIE.2012.2196894},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tie/SmetFHRR13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tie/SmetFHRKLB11,
  author       = {Vanessa Smet and
                  Fran{\c{c}}ois Forest and
                  Jean{-}Jacques Huselstein and
                  Fr{\'{e}}d{\'{e}}ric Richardeau and
                  Zoubir Khatir and
                  St{\'{e}}phane Lefebvre and
                  Mounira Berkani},
  title        = {Ageing and Failure Modes of {IGBT} Modules in High-Temperature Power
                  Cycling},
  journal      = {{IEEE} Trans. Ind. Electron.},
  volume       = {58},
  number       = {10},
  pages        = {4931--4941},
  year         = {2011},
  url          = {https://doi.org/10.1109/TIE.2011.2114313},
  doi          = {10.1109/TIE.2011.2114313},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tie/SmetFHRKLB11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}