Search dblp for Publications

export results for "Zero Trust Approach to IC Manufacturing and Testing."

 download as .bib file

@inproceedings{DBLP:conf/itc/BurasXBK22,
  author       = {Brian Buras and
                  Constantinos Xanthopoulos and
                  Ken Butler and
                  Jason Kim},
  title        = {Zero Trust Approach to {IC} Manufacturing and Testing},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {583--586},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00077},
  doi          = {10.1109/ITC50671.2022.00077},
  timestamp    = {Thu, 12 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BurasXBK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.