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@article{DBLP:journals/tc/NiggemeyerR04,
  author       = {Dirk Niggemeyer and
                  Elizabeth M. Rudnick},
  title        = {Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition
                  and Output Tracing},
  journal      = {{IEEE} Trans. Computers},
  volume       = {53},
  number       = {9},
  pages        = {1134--1146},
  year         = {2004},
  url          = {https://doi.org/10.1109/TC.2004.54},
  doi          = {10.1109/TC.2004.54},
  timestamp    = {Sat, 20 May 2017 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tc/NiggemeyerR04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/todaes/NiggemeyerR03,
  author       = {Dirk Niggemeyer and
                  Elizabeth M. Rudnick},
  title        = {A data acquisition methodology for on-chip repair of embedded memories},
  journal      = {{ACM} Trans. Design Autom. Electr. Syst.},
  volume       = {8},
  number       = {4},
  pages        = {560--576},
  year         = {2003},
  url          = {https://doi.org/10.1145/944027.944037},
  doi          = {10.1145/944027.944037},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/todaes/NiggemeyerR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/te/NiggemeyerSR01,
  author       = {Dirk Niggemeyer and
                  Kevin J. Stephano and
                  Elizabeth M. Rudnick},
  title        = {Use of a field programmable gate array for education in manufacturing
                  test and automatic test equipment},
  journal      = {{IEEE} Trans. Educ.},
  volume       = {44},
  number       = {3},
  pages        = {239--245},
  year         = {2001},
  url          = {https://doi.org/10.1109/13.940994},
  doi          = {10.1109/13.940994},
  timestamp    = {Thu, 16 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/te/NiggemeyerSR01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/NiggemeyerR01,
  author       = {Dirk Niggemeyer and
                  Elizabeth M. Rudnick},
  title        = {Automatic Generation of Diagnostic March Tests},
  booktitle    = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
                  in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
                  {USA}},
  pages        = {299--305},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/VTS.2001.923453},
  doi          = {10.1109/VTS.2001.923453},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/NiggemeyerR01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/BergfeldNR00,
  author       = {Timothy J. Bergfeld and
                  Dirk Niggemeyer and
                  Elizabeth M. Rudnick},
  editor       = {Ivo Bolsens},
  title        = {Diagnostic Testing of Embedded Memories Using {BIST}},
  booktitle    = {2000 Design, Automation and Test in Europe {(DATE} 2000), 27-30 March
                  2000, Paris, France},
  pages        = {305--309},
  publisher    = {{IEEE} Computer Society / {ACM}},
  year         = {2000},
  url          = {https://doi.org/10.1109/DATE.2000.840288},
  doi          = {10.1109/DATE.2000.840288},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/BergfeldNR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/NiggemeyerRR00,
  author       = {Dirk Niggemeyer and
                  Elizabeth M. Rudnick and
                  Michael Redeker},
  title        = {Diagnostic Testing of Embedded Memories Based on Output Tracing},
  booktitle    = {8th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2000), 7-8 August 2000, San Jose, CA, {USA}},
  pages        = {113--118},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/MTDT.2000.868624},
  doi          = {10.1109/MTDT.2000.868624},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/NiggemeyerRR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/mtdt/RedekerRLN00,
  author       = {Michael Redeker and
                  Markus Rudack and
                  Thomas Lobbe and
                  Dirk Niggemeyer},
  title        = {Using GLFSRs for Pseudo-Random Memory {BIST}},
  booktitle    = {8th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2000), 7-8 August 2000, San Jose, CA, {USA}},
  pages        = {85--94},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/MTDT.2000.868620},
  doi          = {10.1109/MTDT.2000.868620},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/RedekerRLN00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/NiggemeyerR99,
  author       = {Dirk Niggemeyer and
                  M. R{\"{u}}ffer},
  title        = {Parametric Built-In Self-Test of {VLSI} Systems},
  booktitle    = {1999 Design, Automation and Test in Europe {(DATE} '99), 9-12 March
                  1999, Munich, Germany},
  pages        = {376},
  publisher    = {{IEEE} Computer Society / {ACM}},
  year         = {1999},
  url          = {https://doi.org/10.1109/DATE.1999.761149},
  doi          = {10.1109/DATE.1999.761149},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/NiggemeyerR99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/RudackN99,
  author       = {Markus Rudack and
                  Dirk Niggemeyer},
  title        = {Yield Enhancement Considerations for a Single-Chip Multiprocessor
                  System with Embedded {DRAM}},
  booktitle    = {14th International Symposium on Defect and Fault-Tolerance in {VLSI}
                  Systems {(DFT} '99), November 1-3, 1999, Albuquerque, NM, USA, Proceedings},
  pages        = {31--39},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/DFTVS.1999.802866},
  doi          = {10.1109/DFTVS.1999.802866},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RudackN99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dac/HilgenstockHONP98,
  author       = {J{\"{o}}rg Hilgenstock and
                  Klaus Herrmann and
                  Jan Otterstedt and
                  Dirk Niggemeyer and
                  Peter Pirsch},
  editor       = {Basant R. Chawla and
                  Randal E. Bryant and
                  Jan M. Rabaey},
  title        = {A Video Signal Processor for {MIMD} Multiprocessing},
  booktitle    = {Proceedings of the 35th Conference on Design Automation, Moscone center,
                  San Francico, California, USA, June 15-19, 1998},
  pages        = {50--55},
  publisher    = {{ACM} Press},
  year         = {1998},
  url          = {https://doi.org/10.1145/277044.277054},
  doi          = {10.1145/277044.277054},
  timestamp    = {Tue, 06 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/HilgenstockHONP98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/NordholzGTONAW98,
  author       = {Petra Nordholz and
                  Hartmut Grabinski and
                  Dieter Treytnar and
                  Jan Otterstedt and
                  Dirk Niggemeyer and
                  Uwe Arz and
                  T. W. Williams},
  editor       = {Patrick M. Dewilde and
                  Franz J. Rammig and
                  Gerry Musgrave},
  title        = {Core Interconnect Testing Hazards},
  booktitle    = {1998 Design, Automation and Test in Europe {(DATE} '98), February
                  23-26, 1998, Le Palais des Congr{\`{e}}s de Paris, Paris, France},
  pages        = {953--954},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/DATE.1998.655985},
  doi          = {10.1109/DATE.1998.655985},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/NordholzGTONAW98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/OtterstedtNW98,
  author       = {Jan Otterstedt and
                  Dirk Niggemeyer and
                  T. W. Williams},
  title        = {Detection of {CMOS} address decoder open faults with March and pseudo
                  random memory tests},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {53--62},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743137},
  doi          = {10.1109/TEST.1998.743137},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/OtterstedtNW98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vts/NordholzTOGNW98,
  author       = {Petra Nordholz and
                  Dieter Treytnar and
                  Jan Otterstedt and
                  Hartmut Grabinski and
                  Dirk Niggemeyer and
                  T. W. Williams},
  title        = {Signal Integrity Problems in Deep Submicron Arising from Interconnects
                  between Cores},
  booktitle    = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
                  Princeton, NJ, {USA}},
  pages        = {28--33},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/VTEST.1998.670845},
  doi          = {10.1109/VTEST.1998.670845},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/NordholzTOGNW98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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