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@inproceedings{DBLP:conf/aitest/AbdelkarimE23,
  author       = {Mohamed Abdelkarim and
                  Reem ElAdawi},
  title        = {TCP-Net++: Test Case Prioritization Using End-to-End Deep Neural Networks
                  - Deployment Analysis and Enhancements},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {99--106},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00024},
  doi          = {10.1109/AITEST58265.2023.00024},
  timestamp    = {Wed, 06 Sep 2023 16:07:23 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/AbdelkarimE23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/AhmedN23,
  author       = {Muyeed Ahmed and
                  Iulian Neamtiu},
  title        = {DeAnomalyzer: Improving Determinism and Consistency in Anomaly Detection
                  Implementations},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {17--25},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00012},
  doi          = {10.1109/AITEST58265.2023.00012},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/AhmedN23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/AlQadasiFB23,
  author       = {Hamzah Al{-}Qadasi and
                  Yli{\`{e}}s Falcone and
                  Saddek Bensalem},
  title        = {Difficulty and Severity-Oriented Metrics for Test Prioritization in
                  Deep Learning Systems},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {40--48},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00015},
  doi          = {10.1109/AITEST58265.2023.00015},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/AlQadasiFB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/AngelisAP23,
  author       = {Emanuele {De Angelis} and
                  Guglielmo De Angelis and
                  Maurizio Proietti},
  title        = {A Classification Study on Testing and Verification of AI-based Systems},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00010},
  doi          = {10.1109/AITEST58265.2023.00010},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/AngelisAP23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/DingWLWH23,
  author       = {Yue Ding and
                  Qian Wu and
                  Yinzhu Li and
                  Dongdong Wang and
                  Jiaxin Huang},
  title        = {Leveraging Deep Learning Models for Cross-function Null Pointer Risks
                  Detection},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {107--113},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00025},
  doi          = {10.1109/AITEST58265.2023.00025},
  timestamp    = {Sat, 09 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/DingWLWH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/EbrahimSYEEAME23,
  author       = {Ehab Ebrahim and
                  Mazen Sayed and
                  Mahmoud Youssef and
                  Hisham Essam and
                  Salma Abd El{-}Fattah and
                  Dina Ashraf and
                  Omar Magdy and
                  Reem ElAdawi},
  title        = {{AI} Decision Assistant ChatBot for Software Release Planning and
                  Optimized Resource Allocation},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {55--60},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00018},
  doi          = {10.1109/AITEST58265.2023.00018},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/EbrahimSYEEAME23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/GhobrialHAE23,
  author       = {Abanoub Ghobrial and
                  Darryl Hond and
                  Hamid Asgari and
                  Kerstin Eder},
  title        = {A Trustworthiness Score to Evaluate {DNN} Predictions},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {9--16},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00011},
  doi          = {10.1109/AITEST58265.2023.00011},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/GhobrialHAE23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/HeRGT23,
  author       = {Yejun He and
                  Muslim Razi and
                  Jerry Zeyu Gao and
                  Chuanqi Tao},
  title        = {A Framework for Autonomous Vehicle Testing Using Semantic Models},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {66--73},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00020},
  doi          = {10.1109/AITEST58265.2023.00020},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/HeRGT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/HenrikssonBUB23,
  author       = {Jens Henriksson and
                  Christian Berger and
                  Stig Ursing and
                  Markus Borg},
  title        = {Evaluation of Out-of-Distribution Detection Performance on Autonomous
                  Driving Datasets},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {74--81},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00021},
  doi          = {10.1109/AITEST58265.2023.00021},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/HenrikssonBUB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/IncorvaiaHA23,
  author       = {Gabriele Incorvaia and
                  Darryl Hond and
                  Hamid Asgari},
  title        = {Uncertainty Quantification for Machine Learning Output Assurance using
                  Anomaly-based Dataset Dissimilarity Measures},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {26--33},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00013},
  doi          = {10.1109/AITEST58265.2023.00013},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/IncorvaiaHA23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/KargozariDC23,
  author       = {Kate Kargozari and
                  Junhua Ding and
                  Haihua Chen},
  title        = {Evaluating the Impact of Incentive/Non-incentive Reviews on Customer
                  Decision-making},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {160--168},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00033},
  doi          = {10.1109/AITEST58265.2023.00033},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/aitest/KargozariDC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/KumarMSDLM23,
  author       = {Yulia Kumar and
                  Patricia Morreale and
                  Peter Sorial and
                  Justin Delgado and
                  J. Jenny Li and
                  Patrick Martins},
  title        = {A Testing Framework for {AI} Linguistic Systems (testFAILS)},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {51--54},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00017},
  doi          = {10.1109/AITEST58265.2023.00017},
  timestamp    = {Thu, 07 Dec 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/aitest/KumarMSDLM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/LandingLKT23,
  author       = {Cristina Landing and
                  Jie Liu and
                  Katerina Katsarou and
                  Sahar Tahvili},
  title        = {Time Series Anomaly Detection using Convolutional Neural Networks
                  in the Manufacturing Process of {RAN}},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {90--98},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00023},
  doi          = {10.1109/AITEST58265.2023.00023},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/LandingLKT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/LinNA23,
  author       = {Weison Lin and
                  Xianpo Ni and
                  Tughrul Arslan},
  title        = {Resource-Aware Online Permanent Fault Detection Mechanism for Streaming
                  Convolution Engine in Edge {AI} Accelerators},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {132--137},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00029},
  doi          = {10.1109/AITEST58265.2023.00029},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/LinNA23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/LuoDLWS23,
  author       = {Xi Luo and
                  Yuhui Deng and
                  Junjie Liu and
                  Sirong Wu and
                  Gengchen Sun},
  title        = {Debunk online rumors via generative-contrastive learning based on
                  tree-transformer},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {152--159},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00032},
  doi          = {10.1109/AITEST58265.2023.00032},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/LuoDLWS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/MagalhaesMJP23,
  author       = {Manuel Magalh{\~{a}}es and
                  {\^{A}}ngelo Morgado and
                  Henrique Jesus and
                  Nuno Pombo},
  title        = {Unlocking the Potential of Dynamic Languages: An Exploration of Automated
                  Unit Test Generation Techniques},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {122--126},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00027},
  doi          = {10.1109/AITEST58265.2023.00027},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/MagalhaesMJP23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/MoranBRT23,
  author       = {Jes{\'{u}}s Mor{\'{a}}n and
                  Antonia Bertolino and
                  Claudio de la Riva and
                  Javier Tuya},
  title        = {Fault Localization for Reinforcement Learning},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {49--50},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00016},
  doi          = {10.1109/AITEST58265.2023.00016},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/MoranBRT23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/NguyenCMHD23,
  author       = {Huyen Nguyen and
                  Haihua Chen and
                  Roopesh Maganti and
                  K. S. M. Tozammel Hossain and
                  Junhua Ding},
  title        = {Measurement and Identification of Informative Reviews for Automated
                  Summarization},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {146--151},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00031},
  doi          = {10.1109/AITEST58265.2023.00031},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/aitest/NguyenCMHD23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/RehmanS23,
  author       = {Faqeer ur Rehman and
                  Madhusudan Srinivasan},
  title        = {Metamorphic Testing For Machine Learning: Applicability, Challenges,
                  and Research Opportunities},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {34--39},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00014},
  doi          = {10.1109/AITEST58265.2023.00014},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/RehmanS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/SekineSMI23,
  author       = {Masatoshi Sekine and
                  Daisuke Shimbara and
                  Tomoyuki Myojin and
                  Eri Imatani},
  title        = {Visualization Tool for Extraction of Various Attributes and Corresponding
                  Data for Dataset Quality Assessment},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {61--65},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00019},
  doi          = {10.1109/AITEST58265.2023.00019},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/SekineSMI23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/SrinivasanIU23,
  author       = {Ramya Srinivasan and
                  Hiroya Inakoshi and
                  Kanji Uchino},
  title        = {Leveraging Cognitive Science for Testing Large Language Models},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {169--171},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00035},
  doi          = {10.1109/AITEST58265.2023.00035},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/SrinivasanIU23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/WozniakDBLSM23,
  author       = {Anne{-}Laure Wozniak and
                  Ngoc Q. K. Duong and
                  Ian Benderitter and
                  Sarah Leroy and
                  Sergio Segura and
                  Ra{\'{u}}l Mazo},
  title        = {Robustness Testing of an Industrial Road Object Detection System},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {82--89},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00022},
  doi          = {10.1109/AITEST58265.2023.00022},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/WozniakDBLSM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/ZhaoCY23,
  author       = {Huanhuan Zhao and
                  Haihua Chen and
                  Hong{-}Jun Yoon},
  title        = {Enhancing Text Classification Models with Generative AI-aided Data
                  Augmentation},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {138--145},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00030},
  doi          = {10.1109/AITEST58265.2023.00030},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/aitest/ZhaoCY23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/aitest/ZhengEB23,
  author       = {Xuan Zheng and
                  Kerstin Eder and
                  Tim Blackmore},
  title        = {Using Neural Networks for Novelty-based Test Selection to Accelerate
                  Functional Coverage Closure},
  booktitle    = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  pages        = {114--121},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023.00026},
  doi          = {10.1109/AITEST58265.2023.00026},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/ZhengEB23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/aitest/2023,
  title        = {{IEEE} International Conference On Artificial Intelligence Testing,
                  AITest 2023, Athens, Greece, July 17-20, 2023},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/AITest58265.2023},
  doi          = {10.1109/AITEST58265.2023},
  isbn         = {979-8-3503-3629-0},
  timestamp    = {Wed, 06 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/aitest/2023.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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