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@inproceedings{DBLP:conf/itc/AbadirB86,
author = {Magdy S. Abadir and
Melvin A. Breuer},
title = {Scan Path with Look Ahead Shifting {(SPLASH)}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {696--704},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 12:22:37 +0200},
biburl = {https://dblp.org/rec/conf/itc/AbadirB86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AghazadehK86,
author = {M. Aghazadeh and
M. Kirschner},
title = {Transient Thermal Characteristics of {VLSI} Devices : Evaluation and
Application},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {428--434},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 26 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AghazadehK86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalM86,
author = {Vishwani D. Agrawal and
M. Ray Mercer},
title = {Deterministic Versus Random Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {718},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AgrawalM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Akers86,
author = {Sheldon B. Akers},
title = {A Parity Bit Signature for Exhaustive Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {48--53},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Akers86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Apfelbaum86,
author = {Larry Apfelbaum},
title = {Improving In-Circuit Diagnosis of Analog Networks with Expert Systems
Techniques},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {947--953},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Apfelbaum86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarberS86,
author = {Mark R. Barber and
Walter I. Satre},
title = {Timing Measurements on {CMOS} {VLSI} Devices Designed to Drive {TTL}
Loads},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {161--168},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BarberS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baril86,
author = {Barry Baril},
title = {{ASIC} Verification: Second Generation Systems and Solutions},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {182--189},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Baril86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Baron86,
author = {Yehuda Baron},
title = {Self Diagnostics on System Level by Design},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {921--929},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Baron86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarzilaiCINRRS86,
author = {Zeev Barzilai and
J. Lawrence Carter and
Vijay S. Iyengar and
Indira Nair and
Barry K. Rosen and
Joe D. Rutledge and
Gabriel M. Silberman},
title = {Efficient Fault Simulation of {CMOS} Circuits with Accurate Models},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {520--529},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 11 Jul 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BarzilaiCINRRS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bedrosian86,
author = {Steve D. Bedrosian},
title = {The Role of Pattern Recognition in {VLSI} Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {750--755},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Bedrosian86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BleekerL86,
author = {Harry Bleeker and
D. van de Lagemaat},
title = {Testing a Board Loaded with Leaded and Surface Mounted Components},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {317--321},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Sun, 13 Sep 2015 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BleekerL86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Braun86,
author = {Arthur R. Braun},
title = {Testing in the Data Communications Industries},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {10--11},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Braun86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bray86,
author = {James D. Bray},
title = {{ATE} Test Head Requirements for Low-Cost {VLSI} Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {568--591},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Bray86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BriersT86,
author = {A. J. Briers and
K. A. E. Totton},
title = {Random Pattern Testability by Fast Fault Simulation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {274--281},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BriersT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BruceHB86,
author = {William C. Bruce and
C. C. Hunter and
L. A. Basto},
title = {Testing Barrel Shifters in Microprocessors},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {145--153},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BruceHB86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BustDK86,
author = {William W. Bust and
Charles R. Darst and
Gregory G. Krysl},
title = {{ABNER} : {A} Burn-In Monitor and Error Reporting System for {PBX}
Systems Test},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {65--73},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BustDK86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakravartyH86,
author = {Sreejit Chakravarty and
Harry B. Hunt III},
title = {On the Computation of Detection Probability for Multiple Faults},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {252--262},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChakravartyH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangRA86,
author = {Hongtao P. Chang and
William A. Rogers and
Jacob A. Abraham},
title = {Structured Functional Level Test Generation Using Binary Decision
Diagrams},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {97--104},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChangRA86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CherkasskyK86,
author = {Vladimir Cherkassky and
Larry L. Kinney},
title = {A Group Probing Strategy for Testing Large Number of Chips},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {853--856},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/CherkasskyK86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiuH86,
author = {George Chiu and
Jean{-}Mark Halbout},
title = {Requirements and Trends for High Speed Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {176--181},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChiuH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chomiczewski86,
author = {Rihard S. Chomiczewski},
title = {{VIVED} : {A} Visual Vector Editor},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {621--625},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Chomiczewski86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Cohen86,
author = {Stephen A. Cohen},
title = {A New Pin Electronics Architecture for High Performance Functional
Module Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {763--770},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Cohen86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CohoonS86,
author = {David P. Cohoon and
Jey Sheridan},
title = {Case History of Networking a Wafer-Sort Area},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {84--89},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/CohoonS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ConcinaLLRR86,
author = {Stefano Concina and
Gerald Liu and
Len Lattanzi and
Semyon Reyfman and
Neil Richardson},
title = {Software Integration in a Workstation-Based F-Beam Tester},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {644--651},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ConcinaLLRR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CortesM86,
author = {Mario L{\'{u}}cio C{\^{o}}rtes and
Edward J. McCluskey},
title = {An Experiment on Intermittent-Failure Mechanisms},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {435--442},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Thu, 28 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CortesM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoxKM86,
author = {Fred Cox and
Lloyd K. Konneker and
Douglas Moreland},
title = {Visual Programming for Analog/Hybrid {ATE}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {631--636},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/CoxKM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Crane86,
author = {Jesse G. Crane},
title = {Testing the Sperry 36/72 Bit {CMOS} Micromainframe Chip Set},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {419--421},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Crane86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaehnG86,
author = {Wilfried Daehn and
Josef Gross},
title = {A Test Generator {IC} for Testing Large CMOS-RAMs},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {18--24},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DaehnG86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaltonADSCKS86,
author = {Earl Dalton and
Walter Ahern and
Stephen Denker and
Ken Sweitzer and
Bill Cooper and
Tom Kelly and
Stan Smith},
title = {Systematic Yield Improvement in Board Testing Practice},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {80--83},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DaltonADSCKS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DammJHSW86,
author = {Wendell Damm and
Pete Janowitz and
Michael Hagen and
YeeMay Shih and
Glenn Widener},
title = {Vernier Method for Calibration ot High-Speed Sampling System},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {220},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DammJHSW86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DavidsonL86,
author = {Scott Davidson and
James L. Lewandowski},
title = {{ESIM/AFS} : {A} Concurrent Architectural Level Fault Simulator},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {375--385},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 12 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DavidsonL86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DayhoffA86,
author = {Judith E. Dayhoff and
Robert W. Atherton},
title = {Financial Impact of Tester Reliability Improvements},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {195--204},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DayhoffA86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ElhuniK86,
author = {Hasan Elhuni and
Larry L. Kinney},
title = {Techniques for Testing Hexagonally Connected Systolic Arrays},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {888--894},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ElhuniK86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Fabish86,
author = {Mike Fabish},
title = {A Strategy for Enhancing Fault Coverage on {VLSI} Circuit Boards Using
Performance In-Circuit Test Techniques},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {312--316},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Fabish86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FlowersMI86,
author = {A. Dale Flowers and
Kamlesh Mathur and
John Isakson},
title = {Statistical Process Control Using the Parametric Tester},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {422--427},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FlowersMI86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FreemanLWM86,
author = {Greg G. Freeman and
Dick L. Liu and
Bruce A. Wooley and
Edward J. McCluskey},
title = {Two {CMOS} Metastability Sensors},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {140--144},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 02 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FreemanLWM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FujiiA86,
author = {Robert H. Fujii and
Jacob A. Abraham},
title = {Approaches to Circuit Level Design for Testability},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {480--483},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FujiiA86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FukuokaOST86,
author = {Kohei Fukuoka and
Ken Ohga and
Atsushi Sugiyama and
Satoshi Takemura},
title = {{DVTS:} Design Verification Techniques for Functional Simulation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {710--717},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FukuokaOST86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GaedeMU86,
author = {Rhonda Kay Gaede and
M. Ray Mercer and
Bill Underwood},
title = {Calculation of Greatest Lower Bounds Obtainable by the Cutting Algorithm},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {498--505},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/GaedeMU86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GilesS86,
author = {Grady Giles and
Kenneth Scheuer},
title = {Testability Features of the {MC68851} {PMMU}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {408--411},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/GilesS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Grillmeyer86,
author = {Oliver Grillmeyer},
title = {Making a Test System Diagnostic Usable},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {972--977},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Grillmeyer86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HaR86,
author = {Dong Sam Ha and
Sudhakar M. Reddy},
title = {On the Design of Random Pattern Testable PLAs},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {688--695},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HaR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hassan86,
author = {Syed Zahoor Hassan},
title = {An Efficient Self-Test Structure for Sequential Machines},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {12--17},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Hassan86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Havener86,
author = {Charles D. Havener},
title = {Issues That Arise in Translating {VLSI} Test Programs Between Testers},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {875--887},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Havener86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Havlicsek86,
author = {Bruce L. Havlicsek},
title = {A Knowledge Based Diagnostic System for Automatic Test Equipment},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {930--938},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Havlicsek86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Henley86,
author = {Francois J. Henley},
title = {Tests of Hermetically Sealed {LSI/VLSI} Devices by Laser Photoexcitation
Logic Analysis},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {607--611},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Henley86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Henshaw86,
author = {Boyd Henshaw},
title = {An {MC68020} Users Test Program},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {386--393},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Henshaw86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HidaiMT86,
author = {Takashi Hidai and
Toshi Matsumoto and
Fumiro Tsuruda},
title = {Test Program Debugging Environment for Linear {IC} Testers},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {869--874},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HidaiMT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hnatek86,
author = {Eugene R. Hnatek},
title = {{IC} Burn-In : The Changing Scene},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {228--231},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Hnatek86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Horn86,
author = {Jody Van Horn},
title = {Accurate, Cost Effective Performance Screening of {VLSI} Circuit Designs},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {169--175},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Horn86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hoye86,
author = {Mary C. Murphy{-}Hoye},
title = {Artificial Intelligence in Semiconductor Manufacturing for Process
Development, Functional Diagnostics, and Yield Crash Prevention},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {939--946},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 25 Apr 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Hoye86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HughesM86,
author = {Joseph L. A. Hughes and
Edward J. McCluskey},
title = {Multiple Stuck-At Fault Coverage of Single Stuck-At Fault Test Sets},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {368--374},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HughesM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuismanCW86,
author = {Leendert M. Huisman and
Larry Carter and
Tom W. Williams},
title = {{TRIM} : Testability Range by Ignoring the Memory},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {474--479},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Mon, 19 Jun 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HuismanCW86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HwangM86,
author = {Ki Soo Hwang and
M. Ray Mercer},
title = {Informed Test Generation Guidance Using Partially Specified Fanout
Constraints},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {113--120},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HwangM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ItazakiK86,
author = {Noriyoshi Itazaki and
Kozo Kinoshita},
title = {Test Pattern Generation for Circuits with Three-state Modules by Improved
Z-algorithm},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {105--112},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ItazakiK86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IvanovA86,
author = {Andr{\'{e}} Ivanov and
Vinod K. Agarwal},
title = {Testability Measures : What Do They Do for {ATPG} ?},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {129--139},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IvanovA86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jenq86,
author = {Yih{-}Chyun Jenq},
title = {Automated Effective-Bit Characterization of Waveform Digitizers},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {978--980},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Fri, 01 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Jenq86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jha86,
author = {Niraj K. Jha},
title = {Detecting Multiple Faults in {CMOS} Circuits},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {514--519},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Jha86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jian-CaoD86,
author = {Jian{-}Cao Wang and
Daozheng Wei},
title = {A New Testability Measure for Digital Circuits},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {506--513},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 18 May 2011 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Jian-CaoD86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JonesB86,
author = {N. A. Jones and
Keith Baker},
title = {An Intelligent Knowledge-Based System Tool for High-Level {BIST} Design},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {743--749},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Sun, 13 Sep 2015 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JonesB86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KanadjianRS86,
author = {A. Kanadjian and
D. Rodgers and
M. Shepherd},
title = {{FIFO} Test Program Development},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {819--825},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KanadjianRS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KawaiSF86,
author = {Masato Kawai and
T. Shimono and
Shigehiro Funatsu},
title = {Test Data Quality Assurance},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {848--852},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Thu, 23 Feb 2012 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KawaiSF86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Keating86,
author = {Michael Keating},
title = {Fundamental Limits to Timing Accuracy},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {756--762},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Keating86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Keating86a,
author = {Michael Keating},
title = {An Improved Search Algorithm},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {987--992},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Keating86a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KildiranM86,
author = {G{\"{u}}nhan Kildiran and
Peter N. Marinos},
title = {Functional Testing of Microprocessor-like Architectures},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {913--920},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KildiranM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kirschling86,
author = {Joe Kirschling},
title = {Quickly Developing Effective Codec Tests on an In-Circuit Board Test
System},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {221--221},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Kirschling86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kirschling86a,
author = {Joe Kirschling},
title = {Testing GaAs Devices with a Digital In-Circuit Test System},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {290--294},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Kirschling86a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KnipsM86,
author = {T. J. Knips and
D. J. Malone},
title = {Designing Characterization Tests for Bipolar Array Performance Verification},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {840--847},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KnipsM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Koeppe86,
author = {S. Koeppe},
title = {Modeling and Simulation of Delay Faults in {CMOS} Logic Circuits},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {530--537},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Koeppe86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kramer86,
author = {Randall Kramer},
title = {{ISDN} Device Testing Demands a New Level of Performance for Automatic
Test Equipment},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {673--682},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Kramer86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrishnamurthyT86,
author = {Balakrishnan Krishnamurthy and
Ioannis G. Tollis},
title = {Improved Techniques for Estimating Signal Probabilities},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {244--251},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KrishnamurthyT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KujiT86,
author = {Norio Kuji and
Teruo Tamama},
title = {An Automated F-Beam Tester with {CAD} Interface, "Finder": {A} Powerful
Tool for Fault Diagnosis of ASICs},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {857--863},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KujiT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LahtiC86,
author = {David O. Lahti and
Grace C. Chen{-}Ellis},
title = {{PROSPECT} : {A} Production System for Partitioning and Evaluating
Chip Testability},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {360--367},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LahtiC86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lala86,
author = {Parag K. Lala},
title = {On Built-In Testing of {VLSI} Chips},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {719--721},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 19 Nov 2003 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lala86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaurentBCC86,
author = {J. Laurent and
L. Bergher and
Bernard Courtois and
Jacques P. Collin},
title = {Towards Automatic Failure Analysis of Complex ICs Through E-Beam Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {465--473},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LaurentBCC86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeS86,
author = {Kim T. Le and
Kewal K. Saluja},
title = {A Novel Approach for Testing Memories Using a Built-In Self Testing
Technique},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {830--839},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Thu, 20 Apr 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LeS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Leckie86,
author = {Ron Leckie},
title = {A Model for Analyzing Test Capacity, Cost, and Productivity},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {213--219},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Leckie86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MakkiT86,
author = {Rafic Z. Makki and
C. Tiansheng},
title = {Designing Testable Control Paths with Multiple and Feedback Scan-Paths},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {484--492},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Fri, 19 Sep 2003 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MakkiT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ManclS86,
author = {Dennis Mancl and
Mark J. Sullivan},
title = {A Solution to Test Data Acquisition and Management},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {60--64},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ManclS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mannan86,
author = {Maqsoodul Mannan},
title = {Instability : {A} {CAD} Dilemma},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {637--643},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Mannan86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maris86,
author = {Willem D. Maris},
title = {Testability, the Achilles Heel of Design},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {7},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Maris86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McAnneyS86,
author = {William H. McAnney and
Jacob Savir},
title = {Built-In Checking of the Correct Self-Test Signature},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {54--59},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/McAnneyS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McIntyre86,
author = {Steven M. McIntyre},
title = {Testing 10-Bit {A/D} Converter with a Digital {VLSI} Tester},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {660--664},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/McIntyre86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mercer86,
author = {M. Ray Mercer},
title = {Logic Elements for Universally Testable Circuits},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {493--497},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Mercer86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Morgan86,
author = {Noah Morgan},
title = {An Automated Menu Screen Generation Software Tool for {VLSI} {ATE}
Programming and Operation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {612--620},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Morgan86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoriwakiITKSH86,
author = {K. Moriwaki and
S. Ishiyama and
K. Takizawa and
F. Kobayashi and
S. Sekine and
Y. Hinataze},
title = {A Test System tor High Density and High Speed Digital Board},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {993--996},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MoriwakiITKSH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mostacciuolo86,
author = {Al Mostacciuolo},
title = {Transmission Problems Encountered When Testing Memory Devices in Parallel
on Memory {ATE}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {808--818},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Mostacciuolo86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mulrooney86,
author = {Timothy J. Mulrooney},
title = {Inexpensive Microprocessor Testing of Custom Integrated Circuits on
Wafers, Packages, and Boards},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {561--567},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 24 Sep 2014 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Mulrooney86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NishimuraHHOFH86,
author = {Y. Nishimura and
Mitsuhiro Hamada and
Hideto Hidaka and
Hideyuki Ozaki and
Kazuyasu Fujishima and
Y. Hayasaka},
title = {Redundancy Test for 1 Mbit {DRAM} Using Multi-Bit-Test Mode},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {826--829},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Fri, 08 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NishimuraHHOFH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NoguchiMKH86,
author = {T. Noguchi and
Atsushi Murakami and
Masato Kawai and
Y. Hayasaka},
title = {Testing for a Solid-State Color Image Sensor},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {683--687},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Wed, 25 Feb 2004 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NoguchiMKH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nohelty86,
author = {Richard Nohelty},
title = {Test System Architecture for Testing Advanced Mixed-Signal Devices},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {225--227},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Nohelty86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Orecchio86,
author = {David P. Orecchio},
title = {ISDN, Analog or Digital Test ?},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {665--672},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Orecchio86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pabst86,
author = {J. Stephen Pabst},
title = {Timing Accuracy and Yield Estimation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {778--787},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Pabst86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParaskevaABKD86,
author = {Mark Paraskeva and
Anthony P. Ambler and
D. F. Burrows and
W. L. Knight and
I. D. Dear},
title = {Economically Viable Automatic Insertion of Self-Test Features for
Custom {VLSI}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {232--243},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Fri, 08 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParaskevaABKD86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Perone86,
author = {Jerry Perone},
title = {Reducing Test Costs Through Strategic Changes in Maintenance and Service},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {205--212},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Perone86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RatfordK86,
author = {Vin Ratford and
Paul Keating},
title = {Integrating Guided Probe and Fault Dictionary: An Enhanced Diagnostic
Approach},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {304--311},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RatfordK86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rich86,
author = {Mark Rich},
title = {A Method of Flexible Catch {RAM} Display for Memory Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {222},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rich86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Roberts86,
author = {Michael J. Roberts},
title = {Challenges in {AC} Testability : Testing Gigahertz Logic},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {9},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Roberts86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rosenfeld86,
author = {Eric Rosenfeld},
title = {Accuracy and Repeatability with {DSP} Test Methods},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {788--797},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rosenfeld86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rosenfeld86a,
author = {Eric Rosenfeld},
title = {{DSP} Measurement of Frequency},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {981--986},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rosenfeld86a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Russell86,
author = {Robert J. Russell},
title = {A Method of Improving In-Circuit Test Effectiveness},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {322--331},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Russell86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SamadF86,
author = {M. Arif Samad and
Jos{\'{e}} A. B. Fortes},
title = {Explanation Capabilities in {DEFT} : {A} Design-For-Testability Expert
System},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {954--963},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SamadF86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sangiovanni-VincentelliW86,
author = {Alberto L. Sangiovanni{-}Vincentelli and
Ruey{-}Sing Wei},
title = {{PROTEUS} : {A} Logic Verification System for Combinational Circuits},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {350--359},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Sangiovanni-VincentelliW86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SarkanyFM86,
author = {Endre F. Sarkany and
J. Feeney and
J. Muhr},
title = {A Functional Test Program Generator},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {864--868},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Thu, 23 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SarkanyFM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SavirM86,
author = {Jacob Savir and
William H. McAnney},
title = {Random Pattern Testability of Delay Faults},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {263--273},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SavirM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchneiderJC86,
author = {Birger Schneider and
Gert J{\o}rgensen and
Mogens B. Christensen},
title = {The Effects of Backdrive Stressing Fast {IC} Technologies},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {452--464},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SchneiderJC86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sedmak86,
author = {Richard M. Sedmak},
title = {On the Possible Limits of External Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {8},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Sedmak86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SeetharamaiahM86,
author = {P. Seetharamaiah and
V. R. Murthy},
title = {Tabular Mechanisation for Flexible Testing of Microprocessors},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {394--407},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SeetharamaiahM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Shalem86,
author = {Shmuel Shalem},
title = {Functional Testing of the {NS32332} {\textbackslash}muProcessor},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {552--560},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Shalem86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShihCODTT86,
author = {F. Warren Shih and
Hu H. Chao and
Shauchi Ong and
Andrew L. Diamond and
Jeffrey Yuh{-}Fong Tang and
Cynthia A. Trempel},
title = {Testability Design for Micro/370, a System/370 Single Chip Microprocessor},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {412--418},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 02 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShihCODTT86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Short86,
author = {Ronald J. Short},
title = {The {DASS} Needs You ! : An Update on the Activities of the {DASS}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {224},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Short86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SilbermanS86,
author = {Gabriel M. Silberman and
Ilan Y. Spillinger},
title = {The Difference Fault Model : Using Functional Fault Simulation to
Obtain Implementation Fault Coverage},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {332--339},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SilbermanS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Simpkins86,
author = {Daniel R. Simpkins},
title = {Testing {FMAX} in a Production Environment},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {771--777},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Simpkins86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Smoody86,
author = {Rik Fischer Smoody},
title = {{ARNOLD:} Applying an {AI} Workstation to Production Test Code Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {740--742},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Smoody86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SodenH86,
author = {Jerry M. Soden and
Charles F. Hawkins},
title = {Reliability and Electrical Properties of Gate Oxide Shorts in {CMOS}
ICs},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {443--451},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SodenH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SrinivasWL86,
author = {Nagendra C. E. Srinivas and
Anthony S. Wojcik and
Ytzhak H. Levendel},
title = {An Artificial Intelligence Based Implementation of the P-Algorithm
for Test Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {732--739},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 10 Jan 2006 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SrinivasWL86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StamelosMPMS86,
author = {Ioannis Stamelos and
M. Melgara and
M. Paolini and
S. Morpurgo and
C. Segre},
title = {A Multi-Level Test Pattern Generation and Validation Environment},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {90--96},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/StamelosMPMS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SubrahmanyamC86,
author = {J. S. R. Subrahmanyam and
Parimal Pal Chaudhuri},
title = {A Divide and Conquer Testing Strategy for Detection of Multiple Faults
by {SFDTS}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {997--1006},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 29 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SubrahmanyamC86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SwentW86,
author = {Richard L. Swent and
Michael J. Ward},
title = {Thermal Analysis of Backdriven Output Transistors},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {295--303},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SwentW86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tamamura86,
author = {Toshio Tamamura},
title = {Video {DAC/ADC} Dynamic Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {652--659},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Tamamura86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TaoHL86,
author = {Dali L. Tao and
Carlos R. P. Hartmann and
Parag K. Lala},
title = {A Concurrent Testing Strategy for PLAs},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {705--709},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Fri, 02 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TaoHL86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Taschioglou86,
author = {Kemon P. Taschioglou},
title = {Test to Eliminate Test},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {223},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Taschioglou86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Teisher86,
author = {Jim Teisher},
title = {Improved Workstation/Tester Interface Is the Key to the Quality of
Test-Program Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {626--630},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Teisher86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TejedaC86,
author = {Al Tejeda and
George Conner},
title = {Innovative Video {RAM} Testing},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {798--807},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TejedaC86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TodokoroYSH86,
author = {Hideo Todokoro and
Shouzou Yoneda and
Sigemitu Seitou and
Sigeyuki Hosoki},
title = {Electron Beam Tester with 10 ps Time Resolution},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {600--606},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TodokoroYSH86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TungR86,
author = {Cheng Hsien Tung and
John P. Robinson},
title = {On Concurrently Testable Microprogrammed Control Units},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {895--900},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TungR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tuszynski86,
author = {Al A. Tuszynski},
title = {Memory Chip Test Economics},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {190--194},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Tuszynski86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VasanthavadaMM86,
author = {Nagesh Vasanthavada and
Peter N. Marinos and
Gerald S. Mersten},
title = {Testing of Fault-Tolerant Clock Systems},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {901--907},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VasanthavadaMM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VeronneauR86,
author = {P. Veronneau and
Pierre N. Robillard},
title = {Proposed Test Method to Prove Software Having a Vector Space Behavior},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {908--912},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VeronneauR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Vida-TorkuMR86,
author = {E. Kofi Vida{-}Torku and
James A. Monzel and
Charles E. Radke},
title = {Performance Assurance of Memories Embedded in {VLSI} Chips},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {154--160},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Vida-TorkuMR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VivierF86,
author = {Chantal Vivier and
Georges Fournie},
title = {Automatic Modelling of {MOS} Transistor Networks for Test Pattern
Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {340--349},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VivierF86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaicukauskiLIR86,
author = {John A. Waicukauski and
Eric Lindbloom and
Vijay S. Iyengar and
Barry K. Rosen},
title = {Transition Fault Simulation by Parallel Pattern Single Fault Propagation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {542--551},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WaicukauskiLIR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wallace86,
author = {John R. Wallace},
title = {Look Who's Refueling the Technology Race},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {3--6},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Wallace86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangM86,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {Circuits for Pseudo-Exhaustive Test Pattern Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {25--37},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangM86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangM86a,
author = {Laung{-}Terng Wang and
Edward J. McCluskey},
title = {A Hybrid Design of Maximum-Length Sequence Generators},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {38--47},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangM86a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WeiS86,
author = {Ruey{-}Sing Wei and
Alberto L. Sangiovanni{-}Vincentelli},
title = {New Front-End and Line Justification Algorithm for Automatic Test
Generation},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {121--128},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WeiS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wells86,
author = {Ben Wells},
title = {A Prober/Handler Interface for High Pin-Count {ASIC} Devices},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {592--599},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Wells86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wilkinson86,
author = {A. Jesse Wilkinson},
title = {Benchmarking an Expert System for Electronic Diagnosis},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {964--971},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Wilkinson86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WilliamsDGS86,
author = {Tom W. Williams and
Wilfried Daehn and
Matthias Gruetzner and
Corot W. Starke},
title = {Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {282--289},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Mon, 19 Jun 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WilliamsDGS86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Winkel86,
author = {Mark D. Winkel},
title = {Using a Relational Database to Develop a Statistical Quality Control
System for {ATE}},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {74--79},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Winkel86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuRR86,
author = {David M. Wu and
Charles E. Radke and
J. Paul Roth},
title = {Statistical {AC} Test Coverage},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {538--541},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 28 Feb 2012 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuRR86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Yau86,
author = {Chi W. Yau},
title = {Concurrent Test Generation Using {AI} Techniques},
booktitle = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
pages = {722--731},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Yau86.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1986,
title = {Proceedings International Test Conference 1986, Washington, D.C.,
USA, September 1986},
publisher = {{IEEE} Computer Society},
year = {1986},
timestamp = {Tue, 22 Oct 2002 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/1986.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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