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@inproceedings{DBLP:conf/itc/AcarO04,
author = {Erkan Acar and
Sule Ozev},
title = {Delayed-RF Based Test Development for {FM} Transceivers Using Signature
Analysis},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {783--792},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387341},
doi = {10.1109/TEST.2004.1387341},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AcarO04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aitken04,
author = {Robert C. Aitken},
title = {A Modular Wrapper Enabling High Speed {BIST} and Repair for Small
Wide Memories},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {997--1005},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387365},
doi = {10.1109/TEST.2004.1387365},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aitken04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aldrich04,
author = {Greg Aldrich},
title = {100 {DPPM} in Nanometer Technology - Is it achievable?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1417},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387425},
doi = {10.1109/TEST.2004.1387425},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aldrich04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmyeenVOL04,
author = {M. Enamul Amyeen and
Srikanth Venkataraman and
Ajay Ojha and
Sangbong Lee},
title = {Evaluation of the Quality of N-Detect Scan {ATPG} Patterns on a Processor},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {669--678},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387328},
doi = {10.1109/TEST.2004.1387328},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AmyeenVOL04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Anderson04,
author = {Thomas J. Anderson},
title = {Practical Instrumentation Integration Considerations},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1078--1080},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387381},
doi = {10.1109/TEST.2004.1387381},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Anderson04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArslanO04,
author = {Baris Arslan and
Alex Orailoglu},
title = {Test Cost Reduction Through {A} Reconfigurable Scan Architecture},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {945--952},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387359},
doi = {10.1109/TEST.2004.1387359},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ArslanO04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BakerN04,
author = {Kendrick Baker and
Mehrdad Nourani},
title = {Interconnect Test Pattern Generation Algorithm For Meeting Device
and Global {SSO} Limits With Safe Initial Vectors},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {163--172},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386949},
doi = {10.1109/TEST.2004.1386949},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BakerN04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BalakrishnanT04,
author = {Kedarnath J. Balakrishnan and
Nur A. Touba},
title = {Improving Encoding Efficiency for Linear Decompressors Using Scan
Inversion},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {936--944},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387358},
doi = {10.1109/TEST.2004.1387358},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BalakrishnanT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BalenAARL04,
author = {Tiago R. Balen and
Antonio Andrade Jr. and
Florence Aza{\"{\i}}s and
Michel Renovell and
Marcelo Lubaszewski},
title = {Testing the Configurable Analog Blocks of Field Programmable Analog
Arrays},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {893--902},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387353},
doi = {10.1109/TEST.2004.1387353},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BalenAARL04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bartenstein04,
author = {Thomas Bartenstein},
title = {Panel 9 - Diagnostics vs. Failure Analysis},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1439},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387447},
doi = {10.1109/TEST.2004.1387447},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bartenstein04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Benware04,
author = {Brady Benware},
title = {Achieving Sub 100 {DPPM} Defect Levels on {VDSM} and Nanometer ASICs},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1418},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387426},
doi = {10.1109/TEST.2004.1387426},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Benware04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BenwareLSKMKKR04,
author = {Brady Benware and
Cam Lu and
John Van Slyke and
Prabhu Krishnamurthy and
Robert Madge and
Martin Keim and
Mark Kassab and
Janusz Rajski},
title = {Affordable and Effective Screening of Delay Defects in ASICs using
the Inline Resistance Fault Model},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1285--1294},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387403},
doi = {10.1109/TEST.2004.1387403},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BenwareLSKMKKR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BhattacharyaC04,
author = {Soumendu Bhattacharya and
Abhijit Chatterjee},
title = {Use of Embedded Sensors for Built-In-Test of {RF} Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {801--809},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387343},
doi = {10.1109/TEST.2004.1387343},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BhattacharyaC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BotaRRSK04,
author = {Sebasti{\`{a}} A. Bota and
M. Rosales and
Jos{\'{e}} Luis Rossell{\'{o}} and
Jaume Segura and
Ali Keshavarzi},
title = {Within Die Thermal Gradient Impact on Clock-Skew: {A} New Type of
Delay-Fault Mechanism},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1276--1284},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387402},
doi = {10.1109/TEST.2004.1387402},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BotaRRSK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrandVMM04,
author = {Kenneth A. Brand and
Erik H. Volkerink and
Edward J. McCluskey and
Subhasish Mitra},
title = {Speed Clustering of Integrated Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1128--1137},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387387},
doi = {10.1109/TEST.2004.1387387},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrandVMM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrownB04,
author = {Jason G. Brown and
R. D. (Shawn) Blanton},
title = {{CAEN-BIST:} Testing the NanoFabric},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {462--471},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386982},
doi = {10.1109/TEST.2004.1386982},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrownB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrownFWLB04,
author = {Dana Brown and
John Ferrario and
Randy Wolf and
Jing Li and
Jayendra Bhagat},
title = {{RF} Testing on a Mixed Signal Tester},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {793--800},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387342},
doi = {10.1109/TEST.2004.1387342},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrownFWLB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Butler04,
author = {Kenneth M. Butler},
title = {Sure You Can Get to 100 {DPPM} in Deep Submicron, But It'll Cost Ya},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1419},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387427},
doi = {10.1109/TEST.2004.1387427},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Butler04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ButlerSFH04,
author = {Kenneth M. Butler and
Jayashree Saxena and
Tony Fryars and
Graham Hetherington},
title = {Minimizing Power Consumption in Scan Testing: Pattern Generation and
{DFT} Techniques},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {355--364},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386971},
doi = {10.1109/TEST.2004.1386971},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ButlerSFH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CabbiboCJ04,
author = {A. Cabbibo and
J. Conder and
M. Jacobs},
title = {Feed Forward Test Methodology Utilizing Device Identification},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {655--660},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387326},
doi = {10.1109/TEST.2004.1387326},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CabbiboCJ04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakravartyST04,
author = {Sreejit Chakravarty and
Eric W. Savage and
Eric N. Tran},
title = {Defect Coverage Analysis of Partitioned Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {907--915},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387355},
doi = {10.1109/TEST.2004.1387355},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChakravartyST04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChandrasekarH04,
author = {Kameshwar Chandrasekar and
Michael S. Hsiao},
title = {Decision Selection and Learning for an All-Solutions {ATPG} Engine},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {607--616},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386998},
doi = {10.1109/TEST.2004.1386998},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChandrasekarH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChatterjeeSK04,
author = {Bhaskar Chatterjee and
Manoj Sachdev and
Ali Keshavarzi},
title = {A {DFT} Technique for Delay Fault Testability and Diagnostics in 32-Bit
High Performance {CMOS} ALUs},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1108--1117},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387385},
doi = {10.1109/TEST.2004.1387385},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChatterjeeSK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengHWLDHHL04,
author = {Kuo{-}Liang Cheng and
Jing{-}Reng Huang and
Chih{-}Wea Wang and
Chih{-}Yen Lo and
Li{-}Ming Denq and
Chih{-}Tsun Huang and
Shin{-}Wei Hung and
Jye{-}Yuan Lee},
title = {An {SOC} Test Integration Platform and Its Industrial Realization},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1213--1222},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387394},
doi = {10.1109/TEST.2004.1387394},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChengHWLDHHL04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiangWHC04,
author = {Chen{-}Huan Chiang and
Paul J. Wheatley and
Kenneth Y. Ho and
Ken L. Cheung},
title = {Testing and Remote Field Update of Distributed Base Stations in a
Wireless Network},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {711--718},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387333},
doi = {10.1109/TEST.2004.1387333},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiangWHC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiangZCR04,
author = {Man Wah Chiang and
Zeljko Zilic and
Jean{-}Samuel Chenard and
Katarzyna Radecka},
title = {Architectures of Increased Availability Wireless Sensor Network Nodes},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1232--1241},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387396},
doi = {10.1109/TEST.2004.1387396},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiangZCR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChickermaneFK04,
author = {Vivek Chickermane and
Brian Foutz and
Brion L. Keller},
title = {Channel Masking Synthesis for Efficient On-Chip Test Compression},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {452--461},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386981},
doi = {10.1109/TEST.2004.1386981},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChickermaneFK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ClarkR04,
author = {C. J. Clark and
Mike Ricchetti},
title = {A Code-less {BIST} Processor for Embedded Test and in-system configuration
of Boards and Systems},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {857--866},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387349},
doi = {10.1109/TEST.2004.1387349},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ClarkR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Cole04,
author = {Edward I. Cole Jr.},
title = {Global Failure Localization: We Have To, But on What and How?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1440},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387448},
doi = {10.1109/TEST.2004.1387448},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Cole04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CornoRTE04,
author = {Fulvio Corno and
Matteo Sonza Reorda and
Simonluca Tosato and
F. Esposito},
title = {Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance
in Automotive Systems},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1332--1339},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387408},
doi = {10.1109/TEST.2004.1387408},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CornoRTE04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Crouch04,
author = {Alfred L. Crouch},
title = {Future Trends in Test: The Adoption and Use of Low Cost Structural
Testers},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {698--703},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387331},
doi = {10.1109/TEST.2004.1387331},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Crouch04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschR04,
author = {W. Robert Daasch and
Manu Rehani},
title = {Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1428},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387436},
doi = {10.1109/TEST.2004.1387436},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DaaschR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaiSYQ04,
author = {Foster F. Dai and
Charles E. Stroud and
Dayu Yang and
Shuying Qi},
title = {Automatic Linearity {(IP3)} Test with Built-in Pattern Generator and
Analyzer},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {271--280},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386961},
doi = {10.1109/TEST.2004.1386961},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DaiSYQ04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DattaGSAd04,
author = {Ramyanshu Datta and
Ravi Gupta and
Antony Sebastine and
Jacob A. Abraham and
Manuel A. d'Abreu},
title = {Tri-Scan: {A} Novel {DFT} Technique for {CMOS} Path Delay Fault Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1118--1127},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387386},
doi = {10.1109/TEST.2004.1387386},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DattaGSAd04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DengG04,
author = {Baolin Deng and
Wolfram Glauert},
title = {Formal Description of Test Specification and {ATE} Architecture for
Mixed-Signal Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1081--1090},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387382},
doi = {10.1109/TEST.2004.1387382},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DengG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DowdingWO04,
author = {David Dowding and
Ernie Wahl and
Don Organ},
title = {Extending {STIL} 1450 Standard for Test Program Flow},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {423--431},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386978},
doi = {10.1109/TEST.2004.1386978},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DowdingWO04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Eklow04,
author = {Bill Eklow},
title = {What Do You Mean My Board Test Stinks?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1423},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387431},
doi = {10.1109/TEST.2004.1387431},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Eklow04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EklowHKPVC04,
author = {Bill Eklow and
Anoosh Hosseini and
Chi Khuong and
Shyam Pullela and
Toai Vo and
Hien Chau},
title = {Simulation Based System Level Fault Insertion Using Co-verification
Tools},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {704--710},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387332},
doi = {10.1109/TEST.2004.1387332},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EklowHKPVC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Fleury04,
author = {H{\'{e}}rv{\'{e}} Fleury},
title = {Electronic circuit comprising a secret sub-module},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1412},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387420},
doi = {10.1109/TEST.2004.1387420},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Fleury04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gattiker04,
author = {Anne E. Gattiker},
title = {Diagnosis Meets Physical Failure Analysis: How Long can we Succeed?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1441},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387449},
doi = {10.1109/TEST.2004.1387449},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gattiker04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GavardoniJPC04,
author = {Maurizio Gavardoni and
Michael Jones and
Russell Poffenberger and
Miguel Conde},
title = {System Monitor for Diagnostic, Calibration and System Configuration},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1263--1268},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387400},
doi = {10.1109/TEST.2004.1387400},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GavardoniJPC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhermanWVHWG04,
author = {Valentin Gherman and
Hans{-}Joachim Wunderlich and
Harald P. E. Vranken and
Friedrich Hapke and
Michael Wittke and
Michael Garbers},
title = {Efficient Pattern Mapping for Deterministic Logic {BIST}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {48--56},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386936},
doi = {10.1109/TEST.2004.1386936},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhermanWVHWG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhoshTB04,
author = {Shalini Ghosh and
Nur A. Touba and
Sugato Basu},
title = {Reducing Power Consumption in Memory {ECC} Checkers},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1322--1331},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387407},
doi = {10.1109/TEST.2004.1387407},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhoshTB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GillisWFM04,
author = {Pamela S. Gillis and
Francis Woytowich and
Andrew Ferko and
Kevin McCauley},
title = {Low Overhead Delay Testing of {ASICS}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {534--542},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386990},
doi = {10.1109/TEST.2004.1386990},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GillisWFM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoorHW04,
author = {Ad J. van de Goor and
Said Hamdioui and
Rob Wadsworth},
title = {Detecting Faults in the Peripheral Circuits and an Evaluation of {SRAM}
Tests},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {114--123},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386943},
doi = {10.1109/TEST.2004.1386943},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoorHW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuWLETTKR04,
author = {Xinli Gu and
Cyndee Wang and
Abby Lee and
Bill Eklow and
Kun{-}Han Tsai and
Jan Arild Tofte and
Mark Kassab and
Janusz Rajski},
title = {Realizing High Test Quality Goals with Smart Test Resource Usage},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {525--533},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386989},
doi = {10.1109/TEST.2004.1386989},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuWLETTKR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuptaH04,
author = {Puneet Gupta and
Michael S. Hsiao},
title = {{ALAPTF:} {A} new Transition Faultmodel and the {ATPG} Algorithm},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1053--1060},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387378},
doi = {10.1109/TEST.2004.1387378},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuptaH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GyvezGCPBK04,
author = {Jos{\'{e}} Pineda de Gyvez and
Guido Gronthoud and
Cristiano Cenci and
Martin Posch and
Thomas Burger and
Manfred Koller},
title = {Power Supply Ramping for Quasi-static Testing of PLLs},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {980--987},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387363},
doi = {10.1109/TEST.2004.1387363},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GyvezGCPBK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hafed04,
author = {Mohamed Hafed},
title = {Glamorous Analog Testability - We Already Test them and Ship Them
- So What is the Problem?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1416},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387424},
doi = {10.1109/TEST.2004.1387424},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hafed04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HafedCDPTLR04,
author = {Mohamed M. Hafed and
Antonio H. Chan and
Geoffrey D. Duerden and
Bardia Pishdad and
Clarence Tam and
S{\'{e}}bastien Laberge and
Gordon W. Roberts},
title = {A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized
Processing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {728--737},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387335},
doi = {10.1109/TEST.2004.1387335},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HafedCDPTLR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HakkinenSVM04,
author = {Juha H{\"{a}}kkinen and
Pekka Syri and
Juha{-}Veikko Voutilainen and
Markku Moilanen},
title = {A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus
for {IEEE} 1149.4},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {551--559},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386992},
doi = {10.1109/TEST.2004.1386992},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HakkinenSVM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HanselS04,
author = {Gert Hansel and
Korbinian Stieglbauer},
title = {Implementation of an Economic Jitter Compliance Test for a Multi-Gigabit
Device on {ATE}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1303--1312},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387405},
doi = {10.1109/TEST.2004.1387405},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HanselS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeinekenK04,
author = {Hans T. Heineken and
Jitendra Khare},
title = {Test Strategies For a 40Gbps Framer SoC},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {758--763},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387338},
doi = {10.1109/TEST.2004.1387338},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeinekenK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HongOC04,
author = {Dongwoo Hong and
Chee{-}Kian Ong and
Kwang{-}Ting (Tim) Cheng},
title = {{BER} Estimation for Serial Links Based on Jitter Spectrum and Clock
Recovery Characteristics},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1138--1147},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387388},
doi = {10.1109/TEST.2004.1387388},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HongOC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HopsSPSPK04,
author = {Jonathan Hops and
Brian Swing and
Brian Phelps and
Bruce Sudweeks and
John Pane and
James Kinslow},
title = {Non-Deterministic {DUT} Behavior During Functional Testing of High
Speed Serial Busses: Challenges and Solutions},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {190--196},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386952},
doi = {10.1109/TEST.2004.1386952},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HopsSPSPK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangTL04,
author = {Jing Huang and
Mehdi Baradaran Tahoori and
Fabrizio Lombardi},
title = {Routability and Fault Tolerance of {FPGA} Interconnect Architectures},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {479--488},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386984},
doi = {10.1109/TEST.2004.1386984},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangTL04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuismanKP04,
author = {Leendert M. Huisman and
Maroun Kassab and
Leah Pastel},
title = {Data Mining Integrated Circuit Fails with Fail Commonalities},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {661--668},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387327},
doi = {10.1109/TEST.2004.1387327},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuismanKP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IrajpourGB04,
author = {Shahdad Irajpour and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Timing-Independent Testing of Crosstalk in the Presence of Delay Producing
Defects Using Surrogate Fault Models},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1024--1033},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387368},
doi = {10.1109/TEST.2004.1387368},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IrajpourGB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JiangOCG04,
author = {Hanjun Jiang and
Beatriz Olleta and
Degang Chen and
Randall L. Geiger},
title = {Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic
Dynamic Element Matched DACs},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1379--1388},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387413},
doi = {10.1109/TEST.2004.1387413},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JiangOCG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Johnson04,
author = {John C. Johnson},
title = {Options for High-Volume Test of Multi-GB/s Ports},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1435},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387443},
doi = {10.1109/TEST.2004.1387443},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Johnson04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jukna04,
author = {Rob Jukna},
title = {To Test or To Inspect, What is the Coverage?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1425},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387433},
doi = {10.1109/TEST.2004.1387433},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jukna04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JunCB04,
author = {Hong Shin Jun and
Sung Soo Chung and
Sang H. Baeg},
title = {Removing {JTAG} Bottlenecks in System Interconnect Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {173--180},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386950},
doi = {10.1109/TEST.2004.1386950},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JunCB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KalidindiHEG04,
author = {Sunil Kalidindi and
Nghia Huynh and
Bill Eklow and
Josh Goldstein},
title = {"Real Life" System Testing of Networking Equipment},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1072--1077},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387380},
doi = {10.1109/TEST.2004.1387380},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KalidindiHEG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kapur04,
author = {Rohit Kapur},
title = {Security vs. Test Quality: Are they mutually exclusive?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1414},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387422},
doi = {10.1109/TEST.2004.1387422},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kapur04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeezerMB04,
author = {David C. Keezer and
Dany Minier and
F. Binette},
title = {Modular Extension of {ATE} to 5 Gbps},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {748--757},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387337},
doi = {10.1109/TEST.2004.1387337},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeezerMB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KellerTBC04,
author = {Brion L. Keller and
Mick Tegethoff and
Thomas Bartenstein and
Vivek Chickermane},
title = {An Economic Analysis and {ROI} Model for Nanometer Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {518--524},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386988},
doi = {10.1109/TEST.2004.1386988},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KellerTBC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhanB04,
author = {Omar I. Khan and
Michael L. Bushnell},
title = {Spectral Analysis for Statistical Response Compaction During Built-In
Self-Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {67--76},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386938},
doi = {10.1109/TEST.2004.1386938},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhanB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Khare04,
author = {Jitendra Khare},
title = {Memory Yield Improvement - SoC Design Perspective},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1445},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387453},
doi = {10.1109/TEST.2004.1387453},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Khare04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimJGC04,
author = {Heon C. Kim and
Hong Shin Jun and
Xinli Gu and
Sung Soo Chung},
title = {At-Speed Interconnect Test and Diagnosis of External Memories on a
System},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {156--162},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386948},
doi = {10.1109/TEST.2004.1386948},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimJGC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KingS04,
author = {Matthew L. King and
Kewal K. Saluja},
title = {Testing Micropipelined Asynchronous Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {329--338},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386968},
doi = {10.1109/TEST.2004.1386968},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KingS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Koenemann04,
author = {Bernd Koenemann},
title = {Test In the Era of "What You see Is {NOT} What You Get"},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {12},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386929},
doi = {10.1109/TEST.2004.1386929},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Koenemann04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrusemanMGE04,
author = {Bram Kruseman and
Ananta K. Majhi and
Guido Gronthoud and
Stefan Eichenberger},
title = {On Hazard-free Patterns for Fine-delay Fault Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {213--222},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386955},
doi = {10.1109/TEST.2004.1386955},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrusemanMGE04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrusemanMHEM04,
author = {Bram Kruseman and
Ananta K. Majhi and
Camelia Hora and
Stefan Eichenberger and
Johan Meirlevede},
title = {Systematic Defects in Deep Sub-Micron Technologies},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {290--299},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386963},
doi = {10.1109/TEST.2004.1386963},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrusemanMHEM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumeUISKHH04,
author = {Masaji Kume and
Katsutoshi Uehara and
Minoru Itakura and
Hideo Sawamoto and
Toru Kobayashi and
Masatoshi Hasegawa and
Hideki Hayashi},
title = {Programmable At-Speed Array and Functional {BIST} for Embedded {DRAM}
{LSI}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {988--996},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387364},
doi = {10.1109/TEST.2004.1387364},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumeUISKHH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduMG04,
author = {Sandip Kundu and
T. M. Mak and
Rajesh Galivanche},
title = {Trends in manufacturing test methods and their implications},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {679--687},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387329},
doi = {10.1109/TEST.2004.1387329},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduMG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuoFOIT04,
author = {Andy Kuo and
Touraj Farahmand and
Nelson Ou and
Andr{\'{e}} Ivanov and
Sassan Tabatabaei},
title = {Jitter Models and Measurement Methods for High-Speed Serial Interconnects},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1295--1302},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387404},
doi = {10.1109/TEST.2004.1387404},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuoFOIT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaiPRC04,
author = {Liyang Lai and
Janak H. Patel and
Thomas Rinderknecht and
Wu{-}Tung Cheng},
title = {Logic {BIST} with Scan Chain Segmentation},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {57--66},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386937},
doi = {10.1109/TEST.2004.1386937},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaiPRC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Laquai04,
author = {Bernd Laquai},
title = {A Model-based Test Approach for Testing High-Speed PLLs and Phase
Regulation Circuitry in {SOC} Devices},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {764--772},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387339},
doi = {10.1109/TEST.2004.1387339},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Laquai04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Larsson04,
author = {Erik Larsson},
title = {Integrating Core Selection in the {SOC} Test Solution Design-Flow},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1349--1358},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387410},
doi = {10.1109/TEST.2004.1387410},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Larsson04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeHJW04,
author = {Geeng{-}Wei Lee and
Juinn{-}Dar Huang and
Jing{-}Yang Jou and
Chun{-}Yao Wang},
title = {Verification on Port Connections},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {830--836},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387346},
doi = {10.1109/TEST.2004.1387346},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeHJW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LevineR04,
author = {Peter M. Levine and
Gordon W. Roberts},
title = {A High-Resolution Flash Time-to-Digital Converter and Calibration
Scheme},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1148--1157},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387389},
doi = {10.1109/TEST.2004.1387389},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LevineR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Li04,
author = {Mike Li},
title = {Is "Design to Production" The Ultimate Answer For Jitter, Noise, and
{BER} Challenges For Multi GB/s ICs?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1433},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387441},
doi = {10.1109/TEST.2004.1387441},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Li04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Li04a,
author = {Mike Li},
title = {Will "Heisenberg Uncertainty Principle" Hold For Designing and Testing
Multiple GB/s ICs?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1436},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387444},
doi = {10.1109/TEST.2004.1387444},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Li04a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiMTW04,
author = {Mike Li and
Andy Martwick and
Gerry Talbot and
Jan B. Wilstrup},
title = {Transfer Functions For The Reference Clock Jitter In {A} Serial Link:
Theory And Applications},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1158--1167},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387390},
doi = {10.1109/TEST.2004.1387390},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiMTW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuSCP04,
author = {Chunsheng Liu and
Hamid Sharif and
{\'{E}}rika F. Cota and
Dhiraj K. Pradhan},
title = {Test Scheduling for Network-on-Chip with {BIST} and Precedence Constraints},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1369--1378},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387412},
doi = {10.1109/TEST.2004.1387412},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuSCP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Madge04,
author = {Robert Madge},
title = {New Test Paradigms for Yield and Manufacturability},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {13},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386930},
doi = {10.1109/TEST.2004.1386930},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Madge04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Madge04a,
author = {Robert Madge},
title = {{ATE} Value Add through Open Data Collection},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1430},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387438},
doi = {10.1109/TEST.2004.1387438},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Madge04a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MadgeBTDSR04,
author = {Robert Madge and
Brady Benware and
Ritesh P. Turakhia and
W. Robert Daasch and
Chris Schuermyer and
Jens Ruffler},
title = {In Search of the Optimum Test Set - Adaptive Test Methods for Maximum
Defect Coverage and Lowest Test Cost},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {203--212},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386954},
doi = {10.1109/TEST.2004.1386954},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MadgeBTDSR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MannTSB04,
author = {William R. Mann and
Frederick L. Taber and
Philip W. Seitzer and
Jerry J. Broz},
title = {The Leading Edge of Production Wafer Probe Test Technology},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1168--1195},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387391},
doi = {10.1109/TEST.2004.1387391},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MannTSB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Marinissen04,
author = {Erik Jan Marinissen},
title = {Security vs. Test Quality: Can We Really Only Have One at a Time?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1411},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387419},
doi = {10.1109/TEST.2004.1387419},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Marinissen04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MarkF04,
author = {Dave Mark and
Jenny Fan},
title = {Localizing Open Interconnect Defects using Targeted Routing in FPGA's},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {627--634},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387000},
doi = {10.1109/TEST.2004.1387000},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MarkF04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MattesDS04,
author = {Heinz Mattes and
Claus Dworski and
Sebastian Sattler},
title = {Controlled Sine Wave Fitting for {ADC} Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {963--971},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387361},
doi = {10.1109/TEST.2004.1387361},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MattesDS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MauckRM04,
author = {Benjamin M. Mauck and
Vishnumohan Ravichandran and
Usman Azeez Mughal},
title = {A Design for Test Technique for Parametric Analysis of {SRAM:} On-Die
Low Yield Analysis},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {105--113},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386942},
doi = {10.1109/TEST.2004.1386942},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MauckRM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MetraMO04,
author = {Cecilia Metra and
T. M. Mak and
Martin Oma{\~{n}}a},
title = {Risks Associated with Faults within Test Pattern Compactors and Their
Implications on Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1223--1231},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387395},
doi = {10.1109/TEST.2004.1387395},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MetraMO04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MichelR04,
author = {Carlos Michel and
Rosa D. Reinosa},
title = {Test Strategy Cost Model Innovations},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {384--392},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386974},
doi = {10.1109/TEST.2004.1386974},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MichelR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MicleaSTBP04,
author = {Liviu Miclea and
Szil{\'{a}}rd Enyedi and
Gavril Toderean and
Alfredo Benso and
Paolo Prinetto},
title = {Towards Microagent based {DBIST/DBISR}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {867--874},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387350},
doi = {10.1109/TEST.2004.1387350},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MicleaSTBP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MitraLM04,
author = {Subhasish Mitra and
Steven S. Lumetta and
Michael Mitzenmacher},
title = {X-Tolerant Signature Analysis},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {432--441},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386979},
doi = {10.1109/TEST.2004.1386979},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MitraLM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiWPTR04,
author = {Grzegorz Mrugalski and
Chen Wang and
Artur Pogiel and
Jerzy Tyszer and
Janusz Rajski},
title = {Fault Diagnosis in Designs with Convolutional Compactors},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {498--507},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386986},
doi = {10.1109/TEST.2004.1386986},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiWPTR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuhtarogluPRT04,
author = {Ali Muhtaroglu and
Benoit Provost and
Tawfik Rahal{-}Arabi and
Greg Taylor},
title = {{I/O} Self-Leakage Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {903--906},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387354},
doi = {10.1109/TEST.2004.1387354},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MuhtarogluPRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mukherjee04,
author = {Nilanjan Mukherjee},
title = {Cost of Test - Taking Control},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1431},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387439},
doi = {10.1109/TEST.2004.1387439},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mukherjee04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nejedlo04,
author = {Jay J. Nejedlo},
title = {Functional Test Coverage Effectiveness on the Decline},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1424},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387432},
doi = {10.1109/TEST.2004.1387432},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nejedlo04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nigh04,
author = {Phil Nigh},
title = {Achieving Quality Levels of 100dpm: It's possible - but roll up your
sleeves and be prepared to do some work.},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1420},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387428},
doi = {10.1109/TEST.2004.1387428},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nigh04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nigh04a,
author = {Phil Nigh},
title = {Redefining {ATE:} "Data Collection Engines that Drive Yield Learning
and Process Optimization"},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1429},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387437},
doi = {10.1109/TEST.2004.1387437},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nigh04a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighG04,
author = {Phil Nigh and
Anne E. Gattiker},
title = {Random and Systematic Defect Analysis Using {IDDQ} Signature Analysis
for Understanding Fails and Guiding Test Decisions},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {309--318},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386966},
doi = {10.1109/TEST.2004.1386966},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NighG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nikawa04,
author = {Kiyoshi Nikawa},
title = {How long can we succeed using the {OBIRCH} and its derivatives?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1443},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387451},
doi = {10.1109/TEST.2004.1387451},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nikawa04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NikilaP04,
author = {K. Nikila and
Rubin A. Parekhji},
title = {{DFT} for Test Optimisations in a Complex Mixed-Signal {SOC} - Case
Study on TI's {TNETD7300} {ADSL} Modem Device},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {773--782},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387340},
doi = {10.1109/TEST.2004.1387340},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NikilaP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Njinda04,
author = {Charles Njinda},
title = {A Hierarchical {DFT} Architecture for Chip, Board and System Test/Debug},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1061--1071},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387379},
doi = {10.1109/TEST.2004.1387379},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Njinda04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Okawara04,
author = {Hideo Okawara},
title = {Precise Pulse Width Measurement in Write Pre-compensation Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {972--979},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387362},
doi = {10.1109/TEST.2004.1387362},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Okawara04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Okuda04,
author = {Yukio Okuda},
title = {Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long
Can We Succeed?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1438},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387446},
doi = {10.1109/TEST.2004.1387446},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Okuda04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PadmanabanT04,
author = {Saravanan Padmanaban and
Spyros Tragoudas},
title = {A Critical Path Selection Method for Delay Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {232--241},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386957},
doi = {10.1109/TEST.2004.1386957},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PadmanabanT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Parker04,
author = {Kenneth P. Parker},
title = {A New Probing Technique for High-Speed/High-Density Printed Circuit
Boards},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {365--374},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386972},
doi = {10.1109/TEST.2004.1386972},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Parker04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Parker04a,
author = {Kenneth P. Parker},
title = {Board Test Coverage Needs to be Standardized},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1426},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387434},
doi = {10.1109/TEST.2004.1387434},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Parker04a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PatelSP04,
author = {Chintan Patel and
Abhishek Singh and
Jim Plusquellic},
title = {Defect detection under Realistic Leakage Models using Multiple {IDDQ}
Measurement},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {319--328},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386967},
doi = {10.1109/TEST.2004.1386967},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PatelSP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pateras04,
author = {Stephen Pateras},
title = {Security vs. Test Quality: Fully Embedded Test Approaches Are the
Key to Having Both},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1413},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387421},
doi = {10.1109/TEST.2004.1387421},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pateras04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Patten04,
author = {Peter Patten},
title = {Divide and Conquer based Fast Shmoo algorithms},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {197--202},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386953},
doi = {10.1109/TEST.2004.1386953},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Patten04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PaulNR04,
author = {Bipul Chandra Paul and
Cassondra Neau and
Kaushik Roy},
title = {Impact of Body Bias on Delay Fault Testing of Nanoscale {CMOS} Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1269--1275},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387401},
doi = {10.1109/TEST.2004.1387401},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PaulNR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PavlovSG04,
author = {Andrei Pavlov and
Manoj Sachdev and
Jos{\'{e}} Pineda de Gyvez},
title = {{AN} {SRAM} Weak Cell Fault Model and a {DFT} Technique with a Programmable
Detection Threshold},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1006--1015},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387366},
doi = {10.1109/TEST.2004.1387366},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PavlovSG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Perez04,
author = {Sergio M. Perez},
title = {The Critical Need For Open {ATE} Architecture},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1409},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387417},
doi = {10.1109/TEST.2004.1387417},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Perez04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PolonskyJWC04,
author = {Stas Polonsky and
Keith A. Jenkins and
Alan J. Weger and
Shinho Cho},
title = {{CMOS} {IC} diagnostics using the luminescence of OFF-state leakage
currents},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {134--139},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386945},
doi = {10.1109/TEST.2004.1386945},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PolonskyJWC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PomeranzVR04,
author = {Irith Pomeranz and
Srikanth Venkataraman and
Sudhakar M. Reddy},
title = {{Z-DFD:} Design-for-Diagnosability Based on the Concept of Z-Detection},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {489--497},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386985},
doi = {10.1109/TEST.2004.1386985},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PomeranzVR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PramanickKEASP04,
author = {Ankan K. Pramanick and
Ramachandran Krishnaswamy and
Mark Elston and
Toshiaki Adachi and
Harsanjeet Singh and
Bruce R. Parnas},
title = {Test Programming Environment in a Modular, Open Architecture Test
System},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {413--422},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386977},
doi = {10.1109/TEST.2004.1386977},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PramanickKEASP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ProvostLBMHTAZM04,
author = {Benoit Provost and
Chee How Lim and
Mo Bashir and
Ali Muhtaroglu and
Tiffany Huang and
Kathy Tian and
Mubeen Atha and
Cangsang Zhao and
Harry Muljono},
title = {{AC} {IO} Loopback Design for High Speed {\(\mathrm{\mu}\)}Processor
{IO} Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {23--30},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386933},
doi = {10.1109/TEST.2004.1386933},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ProvostLBMHTAZM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Qian04,
author = {Jun Qian},
title = {Plan Ahead for Yield},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1447},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387455},
doi = {10.1109/TEST.2004.1387455},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Qian04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/QiuWWRLSB04,
author = {Wangqi Qiu and
Jing Wang and
D. M. H. Walker and
Divya Reddy and
Zhuo Li and
Weiping Shi and
Hari Balachandran},
title = {K Longest Paths Per Gate {(KLPG)} Test Generation for Scan-Based Sequential
Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {223--231},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386956},
doi = {10.1109/TEST.2004.1386956},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/QiuWWRLSB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RaghunathanCAC04,
author = {Ashwin Raghunathan and
Ji Hwan (Paul) Chun and
Jacob A. Abraham and
Abhijit Chatterjee},
title = {Quasi-Oscillation Based Test for Improved Prediction of Analog Performance
Parameters},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {252--261},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386959},
doi = {10.1109/TEST.2004.1386959},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RaghunathanCAC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Raghuraman04,
author = {R. Raghuraman},
title = {Simulation Requirements for Vectors in {ATE} Formats},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1100--1107},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387384},
doi = {10.1109/TEST.2004.1387384},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Raghuraman04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajsumanN04,
author = {Rochit Rajsuman and
Masuda Noriyuki},
title = {Open Architecture Test System: System Architecture and Design},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {403--412},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386976},
doi = {10.1109/TEST.2004.1386976},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajsumanN04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RaoOK04,
author = {Wenjing Rao and
Alex Orailoglu and
Ramesh Karri},
title = {Fault Tolerant Arithmetic with Applications in Nanotechnology based
Systems},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {472--478},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386983},
doi = {10.1109/TEST.2004.1386983},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RaoOK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RavikumarH04,
author = {C. P. Ravikumar and
Graham Hetherington},
title = {A Holistic Parallel and Hierarchical Approach towards Design-For-Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {345--354},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386970},
doi = {10.1109/TEST.2004.1386970},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RavikumarH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RearickPD04,
author = {Jeff Rearick and
Sylvia Patterson and
Krista Dorner},
title = {Integrating Boundary Scan into Multi-GHz {I/O} Circuitry},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {560--566},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386993},
doi = {10.1109/TEST.2004.1386993},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RearickPD04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ReddyCKBB04,
author = {Vijay Reddy and
John M. Carulli and
Anand T. Krishnan and
William Bosch and
Brendan Burgess},
title = {Impact of Negative Bias Temperature Instability on Product Parametric
Drift},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {148--155},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386947},
doi = {10.1109/TEST.2004.1386947},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ReddyCKBB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RehaniAMTS04,
author = {Manu Rehani and
David Abercrombie and
Robert Madge and
Jim Teisher and
Jason Saw},
title = {{ATE} Data Collection - {A} comprehensive requirements proposal to
maximize {ROI} of test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {181--189},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386951},
doi = {10.1109/TEST.2004.1386951},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RehaniAMTS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RemmersVF04,
author = {Jeff Remmers and
Moe Villalba and
Richard Fisette},
title = {Hierarchical {DFT} Methodology - {A} Case Study},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {847--856},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387348},
doi = {10.1109/TEST.2004.1387348},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RemmersVF04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Resnick04,
author = {David Resnick},
title = {Embedded Test for a new Memory-Card Architecture},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {875--882},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387351},
doi = {10.1109/TEST.2004.1387351},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Resnick04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Reynick04,
author = {Joseph A. Reynick},
title = {Investment vs. Yield Relationship for Memories and {IP} in {SOC}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1446},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387454},
doi = {10.1109/TEST.2004.1387454},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Reynick04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Robinson04,
author = {Gordon D. Robinson},
title = {Open Architecture {ATE:} Dream or Reality?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1408},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387416},
doi = {10.1109/TEST.2004.1387416},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Robinson04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchuermyerRD04,
author = {Chris Schuermyer and
Jens Ruffler and
W. Robert Daasch},
title = {Minimum Testing Requirements to Screen Temperature Dependent Defects},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {300--308},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386964},
doi = {10.1109/TEST.2004.1386964},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchuermyerRD04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchuttertGK04,
author = {Rodger Schuttert and
D. C. L. (Erik) van Geest and
A. Kumar},
title = {On-Chip Mixed-Signal Test Structures Re-used for Board Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {375--383},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386973},
doi = {10.1109/TEST.2004.1386973},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchuttertGK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SehgalGMC04,
author = {Anuja Sehgal and
Sandeep Kumar Goel and
Erik Jan Marinissen and
Krishnendu Chakrabarty},
title = {{IEEE} P1500-Compliant Test Wrapper Design for Hierarchical Cores},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1203--1212},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387393},
doi = {10.1109/TEST.2004.1387393},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SehgalGMC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SenGAB04,
author = {Alper Sen and
Vijay K. Garg and
Jacob A. Abraham and
Jayanta Bhadra},
title = {Formal Verification of a System-on-Chip Using Computation Slicing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {810--819},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387344},
doi = {10.1109/TEST.2004.1387344},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SenGAB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sengupta04,
author = {Sanjay Sengupta},
title = {Test Strategies for Nanometer Technologies},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1421},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387429},
doi = {10.1109/TEST.2004.1387429},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sengupta04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SeurenW04,
author = {Geert Seuren and
Tom Waayers},
title = {Extending the Digital Core-based Test Methodology to Support Mixed-Signal},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {281--289},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386962},
doi = {10.1109/TEST.2004.1386962},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SeurenW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Shaikh04,
author = {Saghir A. Shaikh},
title = {{IEEE} Std 1149.6 Implementation for a XAUI-to-Serial 10-Gbps Transceiver},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {543--550},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386991},
doi = {10.1109/TEST.2004.1386991},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Shaikh04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShiM04,
author = {Feng Shi and
Yiorgos Makris},
title = {{SPIN-SIM:} Logic and Fault Simulation for Speed-Independent Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {597--606},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386997},
doi = {10.1109/TEST.2004.1386997},
timestamp = {Fri, 03 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShiM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Shimanouchi04,
author = {Masashi Shimanouchi},
title = {Timing Accuracy Enhancement by a New Calibration Scheme for Multi-Gbps
{ATE}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {567--576},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386994},
doi = {10.1109/TEST.2004.1386994},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Shimanouchi04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinanogluO04,
author = {Ozgur Sinanoglu and
Alex Orailoglu},
title = {Autonomous Yet Deterministic Test of {SOC} Cores},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1359--1368},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387411},
doi = {10.1109/TEST.2004.1387411},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinanogluO04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinghPP04,
author = {Abhishek Singh and
Chintan Patel and
Jim Plusquellic},
title = {On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {262--270},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386960},
doi = {10.1109/TEST.2004.1386960},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinghPP04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SivaramPSWST04,
author = {A. T. Sivaram and
Pascal Pierra and
Shida Sheibani and
Nancy Wang{-}Lee and
Jorge E. Solorzano and
Lily Tran},
title = {Active Tester Interface Unit Design For Data Collection},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {587--596},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386996},
doi = {10.1109/TEST.2004.1386996},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SivaramPSWST04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SivaramSMJ04,
author = {A. T. Sivaram and
Masashi Shimanouchi and
Howard Maassen and
Robert Jackson},
title = {Tester Architecture For The Source Synchronous Bus},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {738--747},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387336},
doi = {10.1109/TEST.2004.1387336},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SivaramSMJ04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Smith04,
author = {Michael J. Smith},
title = {What do you mean my Board Test stinks?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1427},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387435},
doi = {10.1109/TEST.2004.1387435},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Smith04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SongSWX04,
author = {Peilin Song and
Franco Stellari and
Alan J. Weger and
Tian Xia},
title = {A Novel Scan Chain Diagnostics Technique Based on Light Emission from
Leakage Current},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {140--147},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386946},
doi = {10.1109/TEST.2004.1386946},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SongSWX04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sourgen04,
author = {Laurent Sourgen},
title = {Testing a secure device: High coverage with very low observability},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1415},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387423},
doi = {10.1109/TEST.2004.1387423},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sourgen04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sproch04,
author = {Jim Sproch},
title = {A Little {DFT} Goes a Long Way When Testing Multi-Gb/s {I/O} Signals},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1437},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387445},
doi = {10.1109/TEST.2004.1387445},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sproch04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Storey04,
author = {Thomas M. Storey},
title = {Testing in a high volume {DSM} Environment},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1422},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387430},
doi = {10.1109/TEST.2004.1387430},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Storey04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StroudSGH04,
author = {Charles E. Stroud and
John Sunwoo and
Srinivas M. Garimella and
Jonathan Harris},
title = {Built-In Self-Test for System-on-Chip: {A} Case Study},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {837--846},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387347},
doi = {10.1109/TEST.2004.1387347},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StroudSGH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuC04,
author = {Fei Su and
Krishnendu Chakrabarty},
title = {Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed
Biomedical Assays},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {883--892},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387352},
doi = {10.1109/TEST.2004.1387352},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuHWHKCW04,
author = {Chin{-}Lung Su and
Rei{-}Fu Huang and
Cheng{-}Wen Wu and
Chien{-}Chung Hung and
Ming{-}Jer Kao and
Yeong{-}Jar Chang and
Wen Ching Wu},
title = {{MRAM} Defect Analysis and Fault Modeli},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {124--133},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386944},
doi = {10.1109/TEST.2004.1386944},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuHWHKCW04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterRC04,
author = {Stephen K. Sunter and
Aubin Roy and
Jean{-}Francois Cote},
title = {An Automated, Complete, Structural Test Solution for {SERDES}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {95--104},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386941},
doi = {10.1109/TEST.2004.1386941},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterRC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SyalHC04,
author = {Manan Syal and
Michael S. Hsiao and
Sreejit Chakravarty},
title = {Identifying Untestable Transition Faults in Latch Based Designs with
Multiple Clocks},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1034--1043},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387369},
doi = {10.1109/TEST.2004.1387369},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SyalHC04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Syed04,
author = {Ahmed Rashid Syed},
title = {Automatic Delay Calibration Method for Multi-channel {CMOS} Formatter},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {577--586},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386995},
doi = {10.1109/TEST.2004.1386995},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Syed04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TabatabaeiLB04,
author = {Sassan Tabatabaei and
Michael Lee and
Freddy Ben{-}Zeev},
title = {Jitter Generation and Measurement for Test of Multigbps Serial {IO}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1313--1321},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387406},
doi = {10.1109/TEST.2004.1387406},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TabatabaeiLB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tahoori04,
author = {Mehdi Baradaran Tahoori},
title = {Application-Dependent Diagnosis of FPGAs},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {645--654},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387002},
doi = {10.1109/TEST.2004.1387002},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tahoori04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TahooriM04,
author = {Mehdi Baradaran Tahoori and
Subhasish Mitra},
title = {Interconnect Delay Testing of Designs on Programmable Logic Devices},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {635--644},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387001},
doi = {10.1109/TEST.2004.1387001},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TahooriM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TailleferR04,
author = {Christopher S. Taillefer and
Gordon W. Roberts},
title = {Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test
Environment without Increasing Test Time},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {953--962},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387360},
doi = {10.1109/TEST.2004.1387360},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TailleferR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TangWVHWEPB04,
author = {Yuyi Tang and
Hans{-}Joachim Wunderlich and
Harald P. E. Vranken and
Friedrich Hapke and
Michael Wittke and
Piet Engelke and
Ilia Polian and
Bernd Becker},
title = {X-Masking During Logic {BIST} and Its Impact on Defect Coverage},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {442--451},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386980},
doi = {10.1109/TEST.2004.1386980},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TangWVHWEPB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TaylorNCNLSHHB04,
author = {Karen Taylor and
Bryan Nelson and
Alan Chong and
Hieu Nguyen and
Henry C. Lin and
Mani Soma and
Hosam Haggag and
Jeff Huard and
Jim Braatz},
title = {Experimental Results for High-Speed Jitter Measurement Technique},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {85--94},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386940},
doi = {10.1109/TEST.2004.1386940},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TaylorNCNLSHHB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tripp04,
author = {Mike Tripp},
title = {{ITC} 2004 Panel: Cost of Test - Taking Control},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1432},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387440},
doi = {10.1109/TEST.2004.1387440},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tripp04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TrippMM03a,
author = {Mike Tripp and
T. M. Mak and
Anne Meixner},
title = {Elimination of Traditional Functional Testing of Interface Timings
at Intel},
booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
NC, {USA}},
pages = {1448--1456},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387457},
doi = {10.1109/TEST.2004.1387457},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TrippMM03a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Venkataraman04,
author = {Srikanth Venkataraman},
title = {Diagnosis meets Physical Failure Analysis: What is needed to succeed?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1442},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387450},
doi = {10.1109/TEST.2004.1387450},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Venkataraman04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermaRB04,
author = {Amit Verma and
Charles Robinson and
Steve Butkovich},
title = {Production Test Effectiveness of Combined Automated Inspection and
{ICT} Test Strategies},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {393--402},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386975},
doi = {10.1109/TEST.2004.1386975},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VermaRB04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermeulenHKMR04,
author = {Bart Vermeulen and
Camelia Hora and
Bram Kruseman and
Erik Jan Marinissen and
Robert Van Rijsinge},
title = {Trends in Testing Integrated Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {688--697},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387330},
doi = {10.1109/TEST.2004.1387330},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VermeulenHKMR04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VogelsZDBMBNFHGMRT04,
author = {Thomas J. Vogels and
Thomas Zanon and
Rao Desineni and
R. D. (Shawn) Blanton and
Wojciech Maly and
Jason G. Brown and
Jeffrey E. Nelson and
Y. Fei and
X. Huang and
Padmini Gopalakrishnan and
Mahim Mishra and
Vyacheslav Rovner and
S. Tiwary},
title = {Benchmarking Diagnosis Algorithms With a Diverse Set of {IC} Deformations},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {508--517},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386987},
doi = {10.1109/TEST.2004.1386987},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VogelsZDBMBNFHGMRT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WadaNINF04,
author = {Osamu Wada and
Toshimasa Namekawa and
Hiroshi Ito and
Atsushi Nakayama and
Shuso Fujii},
title = {Post-Packaging Auto Repair Techniques for Fast Row Cycle Embedded
{DRAM}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1016--1023},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387367},
doi = {10.1109/TEST.2004.1387367},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WadaNINF04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangAWWFHLT04,
author = {Laung{-}Terng Wang and
Khader S. Abdel{-}Hafez and
Shianling Wu and
Xiaoqing Wen and
Hiroshi Furukawa and
Fei{-}Sheng Hsu and
Shyh{-}Horng Lin and
Sen{-}Wei Tsai},
title = {VirtualScan: {A} New Compressed Scan Technology for Test Cost Reduction},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {916--925},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387356},
doi = {10.1109/TEST.2004.1387356},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangAWWFHLT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangKT04,
author = {Haibo Wang and
Suchitra Kulkarni and
Spyros Tragoudas},
title = {On-line Testing Field Programmable Analog Array Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1340--1348},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387409},
doi = {10.1109/TEST.2004.1387409},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangKT04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WatanabeSO04,
author = {Daisuke Watanabe and
Masakatsu Suda and
Toshiyuki Okayasu},
title = {34.1Gbps Low Jitter, Low {BER} High-Speed Parallel {CMOS} Interface
for Interconnections in High-Speed Memory Test System},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1255--1262},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387399},
doi = {10.1109/TEST.2004.1387399},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WatanabeSO04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/West04,
author = {Burnell G. West},
title = {Open Architecture {ATE:} Prospects and Problems},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1410},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387418},
doi = {10.1109/TEST.2004.1387418},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/West04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WestJ04,
author = {Burnell G. West and
Michael F. Jones},
title = {Digital Synchronization for Reconfigurable {ATE}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1249--1254},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387398},
doi = {10.1109/TEST.2004.1387398},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WestJ04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuH04,
author = {Qingwei Wu and
Michael S. Hsiao},
title = {State Variable Extraction to Reduce Problem Complexity for {ATPG}
and Design Validation},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {820--829},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387345},
doi = {10.1109/TEST.2004.1387345},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuKKG04,
author = {Kaijie Wu and
Ramesh Karri and
Grigori Kuznetsov and
Michael G{\"{o}}ssel},
title = {Low Cost Concurrent Error Detection for the Advanced Encryption Standard},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1242--1248},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387397},
doi = {10.1109/TEST.2004.1387397},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuKKG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuLRJST04,
author = {David M. Wu and
Mike Lin and
Madhukar Reddy and
Talal Jaber and
Anil Sabbavarapu and
Larry Thatcher},
title = {An Optimized {DFT} and Test Pattern Generation Strategy for an Intel
High Performance Microprocessor},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {38--47},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386935},
doi = {10.1109/TEST.2004.1386935},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuLRJST04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WurtenbergerTH04,
author = {Armin W{\"{u}}rtenberger and
Christofer S. Tautermann and
Sybille Hellebrand},
title = {Data Compression for Multiple Scan Chains Using Dictionaries with
Corrections},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {926--935},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387357},
doi = {10.1109/TEST.2004.1387357},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WurtenbergerTH04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04,
title = {International Test Conference - Cover},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386912},
doi = {10.1109/TEST.2004.1386912},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04a,
title = {International Test Conference - Title Page},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {i},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386914},
doi = {10.1109/TEST.2004.1386914},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04b,
title = {International Test Conference - Copyright},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {ii},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386915},
doi = {10.1109/TEST.2004.1386915},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04c,
title = {Welcoming Message},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386921},
doi = {10.1109/TEST.2004.1386921},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04d,
title = {Steering Committee and Subcommittees},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {2--3},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386922},
doi = {10.1109/TEST.2004.1386922},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04e,
title = {Ned Kornfield Memorial},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {4},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386923},
doi = {10.1109/TEST.2004.1386923},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04f,
title = {2003 Paper Awards},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {5},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386924},
doi = {10.1109/TEST.2004.1386924},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04g,
title = {Technical Program Committee},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {6--8},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386925},
doi = {10.1109/TEST.2004.1386925},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04h,
title = {{ITC} Technical Paper Evaluation and Selection Process},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {10},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386927},
doi = {10.1109/TEST.2004.1386927},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04h.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04i,
title = {2005 Call for Papers},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {11},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386928},
doi = {10.1109/TEST.2004.1386928},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04i.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04j,
title = {{TTTC:} Test Technology Technical Council},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {14--16},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386931},
doi = {10.1109/TEST.2004.1386931},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04j.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X04k,
title = {Technical Paper Reviewers},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {17--22},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386932},
doi = {10.1109/TEST.2004.1386932},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X04k.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuN04,
author = {Qiang Xu and
Nicola Nicolici},
title = {Time/Area Tradeoffs in Testing Hierarchical SOCs With Hard Mega-Cores},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1196--1202},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387392},
doi = {10.1109/TEST.2004.1387392},
timestamp = {Thu, 30 Mar 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/XuN04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Yamaguchi04,
author = {Takahiro J. Yamaguchi},
title = {Loopback or not?},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1434},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387442},
doi = {10.1109/TEST.2004.1387442},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Yamaguchi04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiIISKOS04,
author = {Takahiro J. Yamaguchi and
Masahiro Ishida and
Kiyotaka Ichiyama and
Mani Soma and
Christian Krawinkel and
Katsuaki Ohsawa and
Masao Sugai},
title = {A Real-Time Jitter Measurement Board for High-Performance Computer
and Communication Systems},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {77--84},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386939},
doi = {10.1109/TEST.2004.1386939},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiIISKOS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YanS04,
author = {Haihua Yan and
Adit D. Singh},
title = {Evaluating the Effectiveness of Detecting Delay Defects in the Slack
Interval: {A} Simulation Study},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {242--251},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386958},
doi = {10.1109/TEST.2004.1386958},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YanS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangWK04,
author = {Bo Yang and
Kaijie Wu and
Ramesh Karri},
title = {Scan Based Side Channel Attack on Dedicated Hardware Implementations
of Data Encryption Standard},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {339--344},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386969},
doi = {10.1109/TEST.2004.1386969},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangWK04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuCG04,
author = {Zhongjun Yu and
Degang Chen and
Randall L. Geiger},
title = {A Computationally Efficient Method for Accurate Spectral Testing without
Requiring Coherent Sampling},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1398--1407},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387415},
doi = {10.1109/TEST.2004.1387415},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuCG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuSCA04,
author = {Hak{-}soo Yu and
Hongjoong Shin and
Ji Hwan (Paul) Chun and
Jacob A. Abraham},
title = {Performance Characterization of Mixed-Signal Circuits Using a Ternary
Signal Representation},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1389--1397},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387414},
doi = {10.1109/TEST.2004.1387414},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuSCA04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZambaldiE04,
author = {Martin Zambaldi and
Wolfgang Ecker},
title = {How to Bridge the Gap Between Simulationand Test},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1091--1099},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387383},
doi = {10.1109/TEST.2004.1387383},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZambaldiE04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZengAKVWA04,
author = {Jing Zeng and
Magdy S. Abadir and
A. Kolhatkar and
G. Vandling and
Li{-}C. Wang and
Jacob A. Abraham},
title = {On Correlating Structural Tests with Functional Tests for Speed Binning
of High Performance Design},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {31--37},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386934},
doi = {10.1109/TEST.2004.1386934},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZengAKVWA04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangBA04,
author = {Junwu Zhang and
Michael L. Bushnell and
Vishwani D. Agrawal},
title = {On Random Pattern Generation with the Selfish Gene Algorithm for Testing
Digital Sequential Circuits},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {617--626},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1386999},
doi = {10.1109/TEST.2004.1386999},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangBA04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangL04,
author = {Yujun Zhang and
Zhongcheng Li},
title = {{IPV6} Conformance Testing: Theory and Practice},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {719--727},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387334},
doi = {10.1109/TEST.2004.1387334},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangL04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhouM04,
author = {Quming Zhou and
Kartik Mohanram},
title = {Analysis of delay caused by bridging faults in {RLC} interconnects},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1044--1052},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387377},
doi = {10.1109/TEST.2004.1387377},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhouM04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Zorian04,
author = {Yervant Zorian},
title = {Investment vs. Yield Relationship for Memories in {SOC}},
booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
pages = {1444},
publisher = {{IEEE} Computer Society},
year = {2004},
url = {https://doi.org/10.1109/TEST.2004.1387452},
doi = {10.1109/TEST.2004.1387452},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Zorian04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2004,
title = {Proceedings 2004 International Test Conference {(ITC} 2004), October
26-28, 2004, Charlotte, NC, {USA}},
publisher = {{IEEE} Computer Society},
year = {2003},
url = {https://ieeexplore.ieee.org/xpl/conhome/9526/proceeding},
isbn = {0-7803-8581-0},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2004.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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