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Publication search results
found 8 matches
- 2004
- Yongqi Fu, Zhongwei Shen, Ngoi Kok Ann Bryan:
A novel harmless trimming for micro-device with defects and particles in arbitrary geometry by fine milling of focused ion beam. Microelectron. J. 35(2): 111-115 (2004) - 2003
- Jianxia Gao, Mary B. Chan-Park, Dongzhu Xie, Bryan K. A. Ngoi, Chee Yoon Yue:
Sub-Micron Patterning Titanium Nitride By Focused Ion-Beam Technique. Int. J. Comput. Eng. Sci. 4(3): 501-504 (2003) - 2002
- Huimin Xie, Anand K. Asundi, Chai Gin Boay, Lu Yunguang, Jin Yu, Zhaowei Zhong, Bryan K. A. Ngoi:
High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. Microelectron. Reliab. 42(8): 1219-1227 (2002) - 1998
- Swee Hock Yeo, Bryan Kok Ann Ngoi, H. Chen:
Process sequence optimization based on a new cost-tolerance model. J. Intell. Manuf. 9(1): 29-37 (1998) - 1996
- Kian Peng Ngoi, Jiancheng Jia:
A new colour image energy for active contours in natural scenes. Pattern Recognit. Lett. 17(12): 1271-1277 (1996) - Kian Peng Ngoi, Jiancheng Jia:
A Robust Active Contour Model for Natural Scene Contour Extraction with Automatic Thresholding. ECCV (2) 1996: 335-346 - S. S. Lim, B. H. Lee, E. N. Lim, K. A. Ngoi:
Multiple Domain Feature Mapping Utilizing Case-based Reasoning and Blackboard Technology. IEA/AIE 1996: 95-102 - 1995
- S. S. Lim, Lennie E. N. Lim, Ivan Boon Hong Lee, Bryan K. A. Ngoi:
Multiple domain feature mapping: a methodology based on deep models of features. J. Intell. Manuf. 6(4): 245-262 (1995)
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