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Publication search results
found 39 matches
- 2024
- Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu:
DiagNNose: Toward Error Localization in Deep Learning Hardware-Based on VTA-TVM Stack. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 43(1): 217-229 (2024) - Ayush Arunachalam, Ian Kintz, Suvadeep Banerjee, Arnab Raha, Xiankun Jin, Fei Su, Viswanathan Pillai Prasanth, Rubin A. Parekhji, Suriyaprakash Natarajan, Kanad Basu:
Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning. CoRR abs/2404.01632 (2024) - 2023
- Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Suriyaprakash Natarajan, Kanad Basu:
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators. IEEE Des. Test 40(2): 90-99 (2023) - Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Fei Su, Suriyaprakash Natarajan, Kanad Basu:
Trouble-Shooting at GAN Point: Improving Functional Safety in Deep Learning Accelerators. IEEE Trans. Computers 72(8): 2194-2208 (2023) - Ayush Arunachalam, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Suriyaprakash Natarajan, Kanad Basu:
A Novel Low-Power Compression Scheme for Systolic Array-Based Deep Learning Accelerators. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1085-1098 (2023) - Susmita Dey Manasi, Suvadeep Banerjee, Abhijit Davare, Anton A. Sorokin, Steven M. Burns, Desmond A. Kirkpatrick, Sachin S. Sapatnekar:
Reusing GEMM Hardware for Efficient Execution of Depthwise Separable Convolution on ASIC-Based DNN Accelerators. ASP-DAC 2023: 475-482 - Ayush Arunachalam, Sanjay Das, Monikka Rajan, Fei Su, Xiankun Jin, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu:
Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. ITC 2023: 266-275 - 2022
- Ayush Arunachalam, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Kanad Basu:
Fault Resilience of DNN Accelerators for Compressed Sensor Inputs. ISVLSI 2022: 329-332 - Ayush Arunachalam, Athulya Kizhakkayil, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Robert Jin, Fei Su, Kanad Basu:
Unsupervised Learning-based Early Anomaly Detection in AMS Circuits of Automotive SoCs. ITC 2022: 229-238 - Suriyaprakash Natarajan, Abhijit Sathaye, Chaitali Oak, Nipun Chaplot, Suvadeep Banerjee:
DEFCON: Defect Acceleration through Content Optimization. ITC 2022: 298-304 - Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Kanad Basu:
Special Session: Effective In-field Testing of Deep Neural Network Hardware Accelerators. VTS 2022: 1-4 - 2021
- Suvadeep Banerjee, Balavinayagam Samynathan, Jacob A. Abraham, Abhijit Chatterjee:
Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding. IEEE Trans. Dependable Secur. Comput. 18(2): 576-592 (2021) - Shamik Kundu, Suvadeep Banerjee, Arnab Raha, Suriyaprakash Natarajan, Kanad Basu:
Toward Functional Safety of Systolic Array-Based Deep Learning Hardware Accelerators. IEEE Trans. Very Large Scale Integr. Syst. 29(3): 485-498 (2021) - Suvadeep Banerjee, Abhijit Chatterjee:
Online Fast Detection and Diagnosis of Power Grid Security Attacks Using State Checksums. IOLTS 2021: 1-7 - Ayush Arunachalam, Shamik Kundu, Arnab Raha, Suvadeep Banerjee, Suriyaprakash Natarajan, Kanad Basu:
HardCompress: A Novel Hardware-based Low-power Compression Scheme for DNN Accelerators. ISQED 2021: 457-462 - Yash Akhauri, Adithya Niranjan, J. Pablo Muñoz, Suvadeep Banerjee, Abhijit Davare, Pasquale Cocchini, Anton A. Sorokin, Ravi Iyer, Nilesh Jain:
RHNAS: Realizable Hardware and Neural Architecture Search. CoRR abs/2106.09180 (2021) - Suvadeep Banerjee, Steve Burns, Pasquale Cocchini, Abhijit Davare, Shweta Jain, Desmond Kirkpatrick, Anton Sorokin, Jin Yang, Zhenkun Yang:
A Highly Configurable Hardware/Software Stack for DNN Inference Acceleration. CoRR abs/2111.15024 (2021) - 2019
- Suvadeep Banerjee, Abhijit Chatterjee:
ALERA: Accelerated Reinforcement Learning Driven Adaptation to Electro-Mechanical Degradation in Nonlinear Control Systems Using Encoded State Space Error Signatures. ACM Trans. Intell. Syst. Technol. 10(4): 44:1-44:25 (2019) - Barry John Muldrey, Suvadeep Banerjee, Abhijit Chatterjee:
Mixed Signal Design Validation Using Reinforcement Learning Guided Stimulus Generation for Behavior Discovery. VTS 2019: 1-6 - 2018
- Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee:
ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks. ETS 2018: 1-2 - Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee:
Cross-Layer Control Adaptation for Autonomous System Resilience. IOLTS 2018: 261-264 - Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee:
Error Resilient Neuromorphic Networks Using Checker Neurons. IOLTS 2018: 135-138 - 2017
- Suvadeep Banerjee, Abhijit Chatterjee:
Real-time self-learning for control law adaptation in nonlinear systems using encoded check states. ETS 2017: 1-6 - Jacob A. Abraham, Suvadeep Banerjee, Abhijit Chatterjee:
Design of efficient error resilience in signal processing and control systems: From algorithms to circuits. IOLTS 2017: 192-195 - Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
Probabilistic error detection and correction in switched capacitor circuits using checksum codes. IOLTS 2017: 271-276 - Md Imran Momtaz, Suvadeep Banerjee, Abhijit Chatterjee:
On-line diagnosis and compensation for parametric failures in linear state variable circuits and systems using time-domain checksum observers. VTS 2017: 1-6 - 2016
- Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee:
Concurrent error detection and tolerance in Kalman filters using encoded state and statistical covariance checks. IOLTS 2016: 161-166 - Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. ITC 2016: 1-10 - Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Checksum based error detection in linearized representations of non linear control systems. LATS 2016: 182 - Suvadeep Banerjee, Suriyaprakash Natarajan:
Infant mortality tests for analog and mixed-signal circuits. VTS 2016: 1-6
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