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Publication search results
found 137 matches
- 1993
- Miron Abramovici:
DOs and DON'Ts in Computing Fault Coverage. ITC 1993: 594 - Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab:
On Selecting Flip-Flops for Partial Reset. ITC 1993: 1008-1012 - Maria José Aguado, Eduardo de la Torre, Miguel Miranda, Carlos A. López-Barrio:
Distributed Implementation of an ATPG System Using Dynamic Fault Allocation. ITC 1993: 409-418 - Robert C. Aitken:
BP-1992 A Comparison of Defect Models for Fault Location with IDDQ Measurements. ITC 1993: 1051-1060 - Frank W. Angelotti, Wayne A. Britson, Kerry T. Kaliszewski, Steve M. Douskey:
System Level Interconnect Test in a Tristate Environment. ITC 1993: 45-53 - Tom Austin:
Creating A Mixed-Signal Simulation Capability for Concurrent IC Design and Test Program Development. ITC 1993: 125-132 - LaNae J. Avra, Edward J. McCluskey:
Synthesizing for Scan Dependence in Built-In Self-Testable Desings. ITC 1993: 734-743 - S. J. Barnfield, Will R. Moore:
Multiple Fault Diagnosis in Printed Circuit Boards. ITC 1993: 662-671 - J. S. Beasley, H. Ramamurthy, Jaime Ramírez-Angulo, Mark DeYong:
iDD Pulse Response Testing of Analog and Digital CMOS Circuits. ITC 1993: 626-634 - Brian Beck:
Practical Application of Statistical Process Control in Semiconductor Manufacturing. ITC 1993: 99-107 - Israel Beniaminy, Moshe Ben-Bassat, M. Bodenheimer, M. Eshel:
Experience in Diagnosing a Remote, Tele-Controlled Unit Using the AITEST Expert System. ITC 1993: 37-44 - Michael Bershteyn:
Calculatoin of Multiple Sets of Weights for Weighted-Random Testing. ITC 1993: 1031-1040 - Yves Bertrand, Frédéric Bancel, Michel Renovell:
Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. ITC 1993: 989-997 - Heinz Bonnenberg, Andreas Curiger, Norbert Felber, Hubert Kaeslin, Reto Zimmermann, Wolfgang Fichtner:
VINCI: Secure Test of a VLSI High-Speed Encryption System. ITC 1993: 782-790 - Soumitra Bose, Prathima Agrawal, Vishwani D. Agrawal:
Generation of Compact Delay Tests by Multiple-Path Activation. ITC 1993: 714-723 - Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker:
Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460 - Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz:
Application of Statistical Techniques to Critical System Parameters. ITC 1993: 108-114 - James Broseghini, Donald H. Lenhert:
An ALU-Based Programmable MISR/Pseudorandom Generator for a MC68HC11 Family Self-Test. ITC 1993: 349-358 - Gunnar Carlsson:
Test Synthesis from a User Perspective. ITC 1993: 593 - Richard H. Carver:
Mutation-Based Testing of Concurrent Programs. ITC 1993: 845-853 - Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege:
On the Evaluation of Software Inspections and Tests. ITC 1993: 180-189 - Cary Champlin:
IRIDIUMtm Satellite: A Large System Application of Design for Testability. ITC 1993: 392-398 - Samuel T. Chanson, Antonio Alfredo Ferreira Loureiro, Son T. Vuong:
On the Design for Testability of Communication Software. ITC 1993: 190-199 - Anchada Charoenrook, Mani Soma:
Fault Diagnosis of Flash ADC using DNL Test. ITC 1993: 680-689 - Kwang-Ting Cheng, Hsi-Chuan Chen:
Delay Testing for Non-Robust Untestable Circuits. ITC 1993: 954-961 - Joseph B. Costello:
Design and Test: What Will It Take to Tie the Knot? ITC 1993: 18 - Will Creek:
Characterization of Edge Placement Accuracy in High-Speed Digital Pin Electronics. ITC 1993: 556-565 - Wayne T. Daniel:
IEEE 1149.1 Growing Pains. ITC 1993: 264 - Chennian Di, Jochen A. G. Jess:
On Accurate Modeling and Efficient Simulation of CMOS Opens. ITC 1993: 875-882 - Scott Diamond, Bo Janko:
Extraction of Coupled SPICE Models for Packages and Interconnects. ITC 1993: 436-445
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