Остановите войну!
for scientists:
default search action
Search dblp
Full-text search
- > Home
Please enter a search query
- case-insensitive prefix search: default
e.g., sig matches "SIGIR" as well as "signal" - exact word search: append dollar sign ($) to word
e.g., graph$ matches "graph", but not "graphics" - boolean and: separate words by space
e.g., codd model - boolean or: connect words by pipe symbol (|)
e.g., graph|network
Update May 7, 2017: Please note that we had to disable the phrase search operator (.) and the boolean not operator (-) due to technical problems. For the time being, phrase search queries will yield regular prefix search result, and search terms preceded by a minus will be interpreted as regular (positive) search terms.
Author search results
no matches
Venue search results
no matches
Refine list
refine by author
- no options
- temporarily not available
refine by venue
- no options
- temporarily not available
refine by type
- no options
- temporarily not available
refine by access
- no options
- temporarily not available
refine by year
- no options
- temporarily not available
Publication search results
found 33 matches
- 1972
- John F. Betak:
Measuring two-dimensional complexity: A conceptual structure. Pattern Recognit. 4(3): 235-242 (1972) - Robert M. Bowman, Eugene S. McVey:
Calculation of multi-category minimum distance classifier recognition error for binomial measurement distributions. Pattern Recognit. 4(3): 275-288 (1972) - Kenneth J. Breeding, John O. Amoss:
A pattern description language - PADEL. Pattern Recognit. 4(1): 19-36 (1972) - Luigia Carlucci:
A formal system for texture languages. Pattern Recognit. 4(1): 53-72 (1972) - Ronald L. Citrenbaum:
Strategic pattern generation: A solution technique for a class of games. Pattern Recognit. 4(3): 317-329 (1972) - Oscar Firschein, Martin A. Fischler:
A study in descriptive representation of pictorial data. Pattern Recognit. 4(4): 361-366 (1972) - King-Sun Fu:
Introduction to special issue on syntactic pattern recognition--part two. Pattern Recognit. 4(1): 3 (1972) - Israel Gitman:
A parameter-free clustering model. Pattern Recognit. 4(3): 307-315 (1972) - David M. Jackson, Lee J. White:
Effect of random errors on generalized distance computations. Pattern Recognit. 4(3): 263-273 (1972) - Tsuguchika Kaminuma, Satosi Watanabe:
Fast-converging adaptive algorithms for well-balanced separating linear classifier. Pattern Recognit. 4(3): 289-305 (1972) - Brian H. Kaye:
Efficient pattern recognition in fine particle science. Pattern Recognit. 4(2): 147-150 (1972) - Brian H. Kaye, A. G. Naylor:
An optical information procedure for characterizing the shape of fine particle images. Pattern Recognit. 4(2): 195-196 (1972) - Robert S. Ledley:
Editorial comment. Pattern Recognit. 4(1): 1 (1972) - Robert S. Ledley:
Introduction to the special issue on fine particle science. Pattern Recognit. 4(2): 145 (1972) - Robert S. Ledley:
About this issue. Pattern Recognit. 4(3): 233 (1972) - Robert S. Ledley:
About this issue. Pattern Recognit. 4(4): 341 (1972) - A. I. Medalia, G. J. Hornik:
Pattern recognition problems in the study of carbon black. Pattern Recognit. 4(2): 155-158 (1972) - I. B. Muchnik:
Simulation of process of forming the language for description and analysis of the forms of images. Pattern Recognit. 4(1): 101-140 (1972) - John Mylopoulos:
On the application of formal language and automata theory to pattern recognition. Pattern Recognit. 4(1): 37-51 (1972) - Edward A. Patrick, Joseph Altman, Richard Wild:
Computer output display of cells and cell features. Pattern Recognit. 4(2): 211-226 (1972) - Theodosios Pavlidis:
Representation of figures by labeled graphs. Pattern Recognit. 4(1): 5-17 (1972) - Lucio Pietrantonio, Peter C. Jurs:
Iterative least squares development of discriminant functions for spectroscopic data analysis by pattern recognition. Pattern Recognit. 4(4): 391-400 (1972) - Periagaram K. Rajasekaran, Mandyam D. Srinath:
Unsupervised learning in nongaussian pattern recognition. Pattern Recognit. 4(4): 401-416 (1972) - William John Sacco, Wayne S. Copes:
Reduction of the class of feature evaluation techniques in pattern analysis. Pattern Recognit. 4(3): 331-332 (1972) - Sheldon S. Sandler:
Direct three-dimensional analysis of electron micrograph pictures. Pattern Recognit. 4(4): 353-359 (1972) - C. B. Shelman:
The application of list processing techniques to picture processing. Pattern Recognit. 4(2): 201-210 (1972) - Yoshiaki Shirai:
Recognition of polyhedrons with a range finder. Pattern Recognit. 4(3): 243-244 (1972) - Yoshiaki Shirai, Saburo Tsuji:
Extraction of the line drawing of 3-dimensional objects by sequential illumination from several directions. Pattern Recognit. 4(4): 343-344 (1972) - J. C. Simon, A. Checroun, C. Roche:
A method of comparing two patterns independent of possible transformations and small distortions. Pattern Recognit. 4(1): 73-81 (1972) - Philip H. Swain, King-Sun Fu:
Stochastic programmed grammars for syntactic pattern recognition. Pattern Recognit. 4(1): 83-100 (1972)
skipping 3 more matches
loading more results
failed to load more results, please try again later
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from , , and to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from .
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
retrieved on 2024-04-25 01:11 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint