"E-QED: Electrical Bug Localization During Post-silicon Validation Enabled ..."

Eshan Singh, Clark W. Barrett, Subhasish Mitra (2017)

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DOI: 10.1007/978-3-319-63390-9_6

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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Eshan Singh, Clark W. Barrett, Subhasish Mitra:
E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal Methods. CAV (2) 2017: 104-125

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