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"Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in ..."
Seiji Kajihara et al. (1993)
- Seiji Kajihara, Irith Pomeranz, Kozo Kinoshita, Sudhakar M. Reddy:
Cost-Effective Generation of Minimal Test Sets for Stuck-at Faults in Combinational Logic Circuits. DAC 1993: 102-106
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