"An efficient test vector generation for checking analog/mixed-signal ..."

ByongChan Lim, Jaeha Kim, Mark A. Horowitz (2010)

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DOI: 10.1145/1837274.1837468

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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ByongChan Lim, Jaeha Kim, Mark A. Horowitz:
An efficient test vector generation for checking analog/mixed-signal functional models. DAC 2010: 767-772

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