"Logic soft errors in sub-65nm technologies design and CAD challenges."

Subhasish Mitra et al. (2005)

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DOI: 10.1145/1065579.1065585

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Subhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang:
Logic soft errors in sub-65nm technologies design and CAD challenges. DAC 2005: 2-4

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