"Design for test and reliability in ultimate CMOS."

Michael Nicolaidis et al. (2012)

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DOI: 10.1109/DATE.2012.6176556

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep Kulkarni, Vivek De, Dimiter Avresky:
Design for test and reliability in ultimate CMOS. DATE 2012: 677-682

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