"High-quality pattern selection for screening small-delay defects ..."

Ke Peng et al. (2010)

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DOI: 10.1109/DATE.2010.5457036

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty:
High-quality pattern selection for screening small-delay defects considering process variations and crosstalk. DATE 2010: 1426-1431

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