"Hot-swapping architecture with back-biased testing for mitigation of ..."

Zoltán Endre Rákossy et al. (2013)

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DOI: 10.7873/DATE.2013.120

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Zoltán Endre Rákossy, Masayuki Hiromoto, Hiroshi Tsutsui, Takashi Sato, Yukihiro Nakamura, Hiroyuki Ochi:
Hot-swapping architecture with back-biased testing for mitigation of permanent faults in functional unit array. DATE 2013: 535-540

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