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ORCID16. SPIE-VIP 2007: Orlando, Florida, USA
- Zia-ur Rahman, Stephen E. Reichenbach, Mark A. Neifeld:
Visual Information Processing XVI, Orlando, Florida, USA, April 10, 2007. SPIE Proceedings 6575, SPIE 2007, ISBN 978-0-8194-6697-6
Applications of Image Processing
- Marc Lalonde, Samuel Foucher
, Langis Gagnon, E. Pronovost, Maxime Derenne, A. Janelle:
A system to automatically track humans and vehicles with a PTZ camera. 657502 - Nancy Truong, William Agassounon:
Visual signal processing using fly-eye-based algorithm to detect the road edge. 657503 - James Haralambides, Dimitrios Charalampidis:
A progressive de-skewing technique for document image analysis. 657504 - Jun Ke, Pawan K. Baheti, Mark A. Neifeld:
Applications of adaptive feature-specific imaging. 657505
Image Processing Methods I
- Benjamin M. Rodriguez, Gilbert L. Peterson, Sos S. Agaian:
Steganalysis feature improvement using expectation maximization. 657506 - Hrishikesh Karvir, Julie A. Skipper:
Power spectrum weighted edge analysis for straight edge detection in images. 657507 - Numan Unaldi, Vijayan K. Asari:
Local statistics based filtering method for enhancement in super-resolution image reconstruction. 657508 - Omar Aboutalib, Bruce Awalt, Alex Fung, Bea Thai, Jeremy Leibs, Timothy J. Klausutis, Ric Wehling, Matthew Iames:
All source adaptive fusion for aided navigation in non-GPS environment. 657509 - Judith Dijk, Richard J. M. den Hollander, John G. M. Schavemaker, Klamer Schutte:
Local adaptive contrast enhancement for color images. 65750A
Image Processing Methods II
- R. Sundaram:
Image data representation for efficient optimization of objective criterion. 65750B - Premchandra Shankar, Mark A. Neifeld:
Wavelet priors for multiframe image restoration. 65750D - Ahmed Elsafi, Rami Zewail, Nelson G. Durdle:
Elastic image registration using subspace constraints. 65750E - Timothy P. Donovan:
Data mining within digital images. 65750F
Image Processing Tools
- Amit Ashok, Pawan K. Baheti, Mark A. Neifeld:
Task-specific information: an imaging system analysis tool. 65750G - John S. DaPonte, Thomas Sadowski, Christine Caragianis-Broadbridge, D. Day, Ann Lehman, D. Krishna, L. Marinella, Paidemwoyo Munhutu, M. Sawicki:
Application of particle analysis to transmission electron microscopy (TEM). 65750H - Fernando E. Ortiz, Eric J. Kelmelis, Gonzalo R. Arce:
An architecture for the efficient implementation of compressive sampling reconstruction algorithms in reconfigurable hardware. 65750I
Poster Session
- John S. DaPonte, Thomas Sadowski, Christine Caragianis-Broadbridge, D. Day, Ann Lehman, D. Krishna, L. Marinella, Paidemwoyo Munhutu, M. Sawicki:
Comparison of thresholding techniques on nanoparticle images. 65750L - Hossein Rabbani, Mansur Vafadust:
Image denoising in complex wavelet domain using a mixture of bivariate laplacian distributions with local parameters. 65750P - Weilin Hou, Alan D. Weidemann:
Objectively assessing underwater image quality for the purpose of automated restoration. 65750Q - Eric P. Lam:
Image quality measure via a quadtree homogeneity analysis. 65750R
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