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"Application of particle analysis to transmission electron microscopy (TEM)."

John S. DaPonte et al. (2007)

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DOI: 10.1117/12.714749

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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  dblp key:
  - conf/spieVIP/DaPonteSCDLKMMS07
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  persistent URL:
  - https://dblp.org/rec/conf/spieVIP/DaPonteSCDLKMMS07
John S. DaPonte, Thomas Sadowski, Christine Caragianis-Broadbridge, D. Day, Ann Lehman, D. Krishna, L. Marinella, Paidemwoyo Munhutu, M. Sawicki:
Application of particle analysis to transmission electron microscopy (TEM). Visual Information Processing 2007: 65750H

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