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Mark A. Anders 0002

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affiliation: National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA
affiliation (PhD 2017): Penn State University, Department of Engineering Science and Mechanics, University Park, PA, USA

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2020 – today

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2023
[c3]
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  - conf/irps/LenahanFKAMAMFH23
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Patrick M. Lenahan, E. B. Frantz, Sean W. King, Mark A. Anders, S. J. Moxim, James P. Ashton, Kyle J. Myers, M. E. Flatté, N. J. Harmon:
Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics. IRPS 2023: 1-6

2010 – 2019

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2019
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James P. Ashton, Patrick M. Lenahan, Daniel J. Lichtenwalner, Aivars J. Lelis, Mark A. Anders:
Reliability and Performance Issues in SiC MOSFETs: Insight Provided by Spin Dependent Recombination. IRPS 2019: 1-5
2018
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Patrick M. Lenahan, Mark A. Anders, R. J. Waskiewicz, Aivars J. Lelis:
Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance. Microelectron. Reliab. 81: 1-6 (2018)
2015
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Mark A. Anders, Patrick M. Lenahan, Aivars J. Lelis:
Negative bias instability in 4H-SiC MOSFETS: Evidence for structural changes in the SiC. IRPS 2015: 3

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