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ORCIDChristophe Kelma
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2010 – 2019
- 2013
[c9]Christophe Kelma, Sébastien Darfeuille, Andreas Neuburger, Andreas Lobnig:
RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology. ETS 2013: 1- [c8]Jan van Sinderen, Gerben W. de Jong, Frank Leong, Xin He, Melina Apostolidou, Harish Kundur Subramaniyan, Robert Rutten, Jan Niehof, Jos Verlinden, Hao Wang, Anton Hoogstraate, Ka Chun Kwok, Rene Verlinden, Reinier Hoogendoorn, Dennis Jeurissen, Anton Salfelner, Ewald Bergler, Javier M. Velandia Torres, Christopher J. Haji-Michael, Thomas Unterweger, Esa Tarvainen, Martin Posch
, Reinhold Schmidt, Markus Stattmann, Jacek Tyminski, Patrick Jean, Sébastien Darfeuille, Olivier Aymard, Alexis le Grontec, Claire Boucey, Christophe Kelma, Guillaume Monnerie:
Wideband UHF ISM-band transceiver supporting multichannel reception and DSSS modulation. ISSCC 2013: 454-455 - [c7]Imene Lahbib, Mohamed-Aziz Doukkali, Philippe Descarnps, Christophe Kelma, Olivier Tesson:
Design of an embedded RF signal generator for BIST application. NEWCAS 2013: 1-4 - 2012
- [c6]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
Experiences with non-intrusive sensors for RF built-in test. ITC 2012: 1-8 - [c5]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma:
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS 2012: 19-24 - 2011
- [j1]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
RF Front-End Test Using Built-in Sensors. IEEE Des. Test Comput. 28(6): 76-84 (2011) - [c4]Sébastien Darfeuille, Christophe Kelma:
Production test of an RF receiver chain based on ATM combining RF BIST and machine learning algorithm. ECCTD 2011: 653-656 - 2010
- [c3]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir:
Sensors for built-in alternate RF test. ETS 2010: 49-54
2000 – 2009
- 2009
- [c2]Bilal El Kassir, Christophe Kelma, Bernard Jarry, Michel Campovecchio:
Built-in Self Test for Error Vector Magnitude measurement of RF transceiver. ITC 2009: 1 - 2006
- [c1]Sofiane Ellouz, Patrice Gamand, Christophe Kelma, Bertrand Vandewiele, Bruno Allard:
Combining Internal Probing with Artificial Neural Networks for Optimal RFIC Testing. ITC 2006: 1-9
Coauthor Index
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