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2020 – today
- 2023
[j18]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits. J. Electron. Test. 39(2): 155-170 (2023)- 2021
- [j17]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit. J. Electron. Test. 37(2): 225-242 (2021) - [c30]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre:
Exploring on-line RF performance monitoring based on the indirect test strategy. LATS 2021: 1-7 - 2020
- [j16]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits. J. Electron. Test. 36(2): 189-203 (2020) - [c29]Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea
, T. Vayssade, Arnaud Virazel:
Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs. IOLTS 2020: 1-4 - [c28]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot:
Implementing indirect test of RF circuits without compromising test quality: a practical case study. LATS 2020: 1-6
2010 – 2019
- 2019
- [j15]Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell:
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. J. Electron. Test. 35(1): 59-75 (2019) - [c27]Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre:
Use of ensemble methods for indirect test of RF circuits: can it bring benefits? LATS 2019: 1-6 - [c26]Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre:
Which metrics to use for RF indirect test strategy? SMACD 2019: 73-76 - 2018
- [c25]Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell:
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. LATS 2018: 1-5 - 2017
- [j14]Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell:
Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies. J. Electron. Test. 33(4): 515-527 (2017) - [c24]Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh:
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions. ETS 2017: 1-2 - [c23]Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh:
Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology. ISVLSI 2017: 320-325 - 2016
- [j13]Aida Todri-Sanial, Saraju P. Mohanty, Mariane Comte, Marc Belleville:
Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era. ACM J. Emerg. Technol. Comput. Syst. 13(2): 12:1-12:2 (2016) - [c22]Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell:
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations. ISVLSI 2016: 164-169 - [c21]Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell:
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect. LATS 2016: 129-134 - 2015
- [j12]Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies. Microelectron. J. 46(11): 1091-1102 (2015) - [c20]Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy. ISVLSI 2015: 621-626 - [c19]Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard:
Toward Adaptation of ADCs to Operating Conditions through On-chip Correction. ISVLSI 2015: 634-639 - 2014
- [j11]Jean-Marc Gallière, Florence Azaïs, Mariane Comte, Michel Renovell:
Testing for gate oxide short defects using the detectability interval paradigm. it Inf. Technol. 56(4): 173-181 (2014) - [j10]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45(3): 336-344 (2014) - [c18]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
New implementions of predictive alternate analog/RF test with augmented model redundancy. DATE 2014: 1-4 - [c17]Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos:
Solutions for the self-adaptation of communicating systems in operation. IOLTS 2014: 234-239 - [c16]Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell:
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing. LATW 2014: 1-6 - 2013
- [j9]Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell:
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC. Microelectron. J. 44(9): 840-843 (2013) - [c15]Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian:
MIRID: Mixed-Mode IR-Drop Induced Delay Simulator. Asian Test Symposium 2013: 177-182 - [c14]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Implementing model redundancy in predictive alternate test to improve test confidence. ETS 2013: 1 - [c13]Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, Ilia Polian, Bernd Becker:
Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays. LATW 2013: 1-6 - [c12]Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti:
Accurate and efficient analytical electrical model of antenna for NFC applications. NEWCAS 2013: 1-4 - 2012
- [c11]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell:
Making predictive analog/RF alternate test strategy independent of training set size. ITC 2012: 1-9 - [c10]Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma:
Smart selection of indirect parameters for DC-based alternate RF IC testing. VTS 2012: 19-24 - 2011
- [j8]Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell:
Digital Test Method for Embedded Converters with Unknown-Phase Harmonics. J. Electron. Test. 27(3): 335-350 (2011)
2000 – 2009
- 2009
- [c9]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A multi-converter DFT technique for complex SIP: Concepts and validation. ECCTD 2009: 747-750 - [c8]Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker:
An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects. VTS 2009: 21-26 - 2008
- [j7]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib:
ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator. VLSI Design 2008: 482159:1-482159:8 (2008) - [c7]Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker:
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. ETS 2008: 113-118 - 2007
- [j6]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1(3): 146-153 (2007) - [c6]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2007: 211-216 - 2006
- [j5]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. IEEE Des. Test Comput. 23(3): 234-243 (2006) - [c5]Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker:
A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency. ATS 2006: 273-278 - [c4]Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell:
Electrical Behavior of GOS Fault affected Domino Logic Cell. DELTA 2006: 183-189 - [c3]Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. ETS 2006: 159-164 - 2005
- [j4]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell:
Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications. J. Electron. Test. 21(3): 291-298 (2005) - 2004
- [j3]Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell:
Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors. J. Electron. Test. 20(3): 257-267 (2004) - [j2]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell:
Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure. J. Electron. Test. 20(4): 375-387 (2004) - 2003
- [j1]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell:
A-to-D converters static error detection from dynamic parameter measurement. Microelectron. J. 34(10): 945-953 (2003) - [c2]Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell:
A New Methodology For ADC Test Flow Optimization. ITC 2003: 201-209 - 2002
- [c1]Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski:
Estimating Static Parameters of A-to-D Converters from Spectral Analysis. LATW 2002: 174-179
Coauthor Index
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