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Sandro Pinarello

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2010 – 2019

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2015
[c2]
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  - conf/irps/CattaneoPMW15
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Andrea Cattaneo, Sandro Pinarello, Jan-Erik Mueller, Robert Weigel:
Impact of DC and RF non-conducting stress on nMOS reliability. IRPS 2015: 4
2014
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Andrea Cattaneo, Sandro Pinarello, Jan-Erik Mueller, Robert Weigel:
MOSFET degradation under DC and RF Fowler-Nordheim stress. ESSDERC 2014: 230-233

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