"MOSFET degradation under DC and RF Fowler-Nordheim stress."

Andrea Cattaneo et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948802

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-29

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Andrea Cattaneo, Sandro Pinarello, Jan-Erik Mueller, Robert Weigel:
MOSFET degradation under DC and RF Fowler-Nordheim stress. ESSDERC 2014: 230-233

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