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Sergei Magonov
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2020 – today
- 2023
- [c12]Sergey Belikov, John Alexander, Sergei Magonov:
Constrained Nonlinear Programming for Image-Based Hysteresis Compensation in Atomic Force Microscope Piezo Actuators. CoDIT 2023: 2489-2495
2010 – 2019
- 2019
- [c11]Sergey Belikov, Sergei Magonov:
Simulation of Asymptotic Amplitude-Phase Dynamics for AFM Resonant Modes. ACC 2019: 2477-2482 - 2018
- [c10]Sergey Belikov, John Alexander, Sergei Magonov:
Dynamic Probe Calibration for Quantitative Measurements with Atomic Force Microscopy. ACC 2018: 5100-5105 - [c9]Sergey Belikov, Marko Surtchev, Ivan Malovichko, Sergei Magonov:
Quantitative Viscoelasticity Studies with Atomic Force Microscopy. ACC 2018: 5244-5249 - 2017
- [c8]Sergey Belikov, John Alexander, Marko Surtchev, Ivan Malovichko, Sergei Magonov:
Automatic probe landing in Atomic Force Microscopy resonance modes. ACC 2017: 2894-2899 - 2016
- [c7]Sergey Belikov, John Alexander, Marko Surtchev, Sergei Magonov:
Implementation of atomic force microscopy resonance modes based on asymptotic dynamics using Costas Loop. ACC 2016: 6201-6208 - 2015
- [c6]Sergey Belikov, Ivan Yermolenko, Sergei Magonov:
Modeling and measurements in Atomic Force Microscopy Resonance Modes. ACC 2015: 3484-3489 - 2014
- [c5]Sergey Belikov, John Alexander, Craig Wall, Ivan Yermolenko, Sergei Magonov, Ivan Malovichko:
Thermal tune method for AFM oscillatory resonant imaging in air and liquid. ACC 2014: 1009-1014 - 2012
- [c4]Sergey Belikov, John Alexander, Sergei Magonov, Ivan Yermolenko:
Atomic Force Microscopy control system for electrostatic measurements based on mechanical and electrical modulation. ACC 2012: 3228-3233 - 2011
- [c3]Sergey Belikov, Sergei Magonov:
Tip-sample interaction force modeling for AFM simulation, control design, and material property measurement. ACC 2011: 2867-2872 - 2010
- [c2]Sergey Belikov, Sergei Magonov:
Simulation of atomic force microscopy of molecular structures and interplay with experiment. ACC 2010: 5745-5750
2000 – 2009
- 2009
- [c1]Sergey Belikov, Sergei Magonov:
Classification of dynamic atomic force microscopy control modes based on asymptotic nonlinear mechanics. ACC 2009: 979-984
Coauthor Index
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