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Vasileios Tenentes
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2020 – today
- 2024
- [j12]Asimina Koutra
, Vasileios Tenentes
:
Multi-Vt-Based Energy Efficiency Optimization for ASIC Designs of the Double Secure Hash Algorithm Toward a Sustainable Bitcoin Network. IEEE Trans. Circuits Syst. II Express Briefs 71(3): 1596-1600 (2024) - [c30]Vasileios Tenentes, Stefano Di Matteo
, Christos Zonios
, Daniele Rossi
, Sergio Saponara
:
RTL Flow for the Power Side-Channel Resilience Assessment of a Post-Quantum SHA-3 Accelerator. MOCAST 2024: 1-5 - [c29]Konstantinos Tsampiras
, Anastasios Liontos, Vasileios Tenentes:
Evaluating Trusted Firmware Remote Attestation on ARM and RISC-V Edge Computing Prototypes. MOCAST 2024: 1-4 - 2023
- [c28]Asimina Koutra, Vasileios Tenentes
:
High Throughput and Energy Efficient SHA-2 ASIC Design for Continuous Integrity Checking Applications. ETS 2023: 1-6 - [c27]Athanasios Xynos, Vasileios Tenentes
, Yiorgos Tsiatouhas
:
SiCBit-PUF: Strong in-Cache Bitflip PUF Computation for Trusted SoCs. ETS 2023: 1-6 - [c26]Athanasios Xynos, Vasileios Tenentes
:
MetaSPICE: Metaprogramming SPICE Framework for the Design Space Exploration of PUF Circuits. MOCAST 2023: 1-4 - [c25]Daniele Rossi
, Nicasio Canino, Stefano Di Matteo
, Sergio Saponara
, Vasileios Tenentes
:
Design and Evaluation of a Peripheral for Integrity Checking to Improve RAS in RISC-V Architectures. SEEDA-CECNSM 2023: 1-6 - [c24]Vasileios Tenentes
, Athanasios Xynos, Christos Zonios
, Asimina Koutra, Christina Dilopoulou
, Konstantinos Tsampiras
, Yiorgos Tsiatouhas
, Daniele Rossi
:
Embedded Platforms for Trusted Edge Computing Towards Quality Assurance Along the Supply Chain. SEEDA-CECNSM 2023: 1-6 - 2022
- [c23]Christos Zonios
, Vasileios Tenentes
:
REVOLVER: A Zero-Step Execution Emulation Framework for Mitigating Power Side-Channel Attacks on ARM64. IOLTS 2022: 1-6 - 2021
- [c22]Christos Zonios
, Vasileios Tenentes
:
Energy Efficient Speech Command Recognition for Private Smart Home IoT Applications. MOCAST 2021: 1-4
2010 – 2019
- 2019
- [c21]Vasileios Tenentes
, Shidhartha Das, Daniele Rossi
, Bashir M. Al-Hashimi:
Run-time Detection and Mitigation of Power-Noise Viruses. IOLTS 2019: 275-280 - [c20]Abdessamad Najdi, Daniele Rossi
, Vasileios Tenentes
:
Analysis on Retention Time and Adaptive Refresh in Embedded DRAMs with Aging Benefits. IOLTS 2019: 281-286 - 2018
- [j11]Vasileios Tenentes
, Daniele Rossi
, S. Saqib Khursheed, Bashir M. Al-Hashimi, Krishnendu Chakrabarty
:
Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 883-895 (2018) - [j10]Daniele Rossi
, Vasileios Tenentes
, Sudhakar M. Reddy
, Bashir M. Al-Hashimi, Andrew D. Brown:
Exploiting Aging Benefits for the Design of Reliable Drowsy Cache Memories. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(7): 1345-1357 (2018) - [c19]Daniele Rossi
, Vasileios Tenentes
, S. Saqib Khursheed, Sudhakar M. Reddy:
Recycled IC detection through aging sensor. ETS 2018: 1-2 - [c18]Vasileios Tenentes
, Daniele Rossi
, Bashir M. Al-Hashimi:
Collective-Aware System-on-Chips for Dependable IoT Applications. IOLTS 2018: 57-60 - 2017
- [j9]Mauricio D. Gutierrez
, Vasileios Tenentes
, Daniele Rossi
, Tom J. Kazmierski:
Susceptible Workload Evaluation and Protection using Selective Fault Tolerance. J. Electron. Test. 33(4): 463-477 (2017) - [j8]Daniele Rossi
, Vasileios Tenentes
, Sheng Yang, Syed Saqib Khursheed, Bashir M. Al-Hashimi:
Aging Benefits in Nanometer CMOS Designs. IEEE Trans. Circuits Syst. II Express Briefs 64-II(3): 324-328 (2017) - [j7]Vasileios Tenentes
, Daniele Rossi
, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi, Steve R. Gunn:
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1397-1407 (2017) - [c17]Mauricio D. Gutierrez, Vasileios Tenentes
, Tom J. Kazmierski, Daniele Rossi
:
Low cost error monitoring for improved maintainability of IoT applications. DFT 2017: 1-6 - [c16]Vasileios Tenentes
, Charles Leech, Graeme M. Bragg, Geoff V. Merrett, Bashir M. Al-Hashimi, Hussam Amrouch
, Jörg Henkel, Shidhartha Das:
Hardware and software innovations in energy-efficient system-reliability monitoring. DFT 2017: 1-5 - [c15]Mauricio D. Gutierrez, Vasileios Tenentes
, Tom J. Kazmierski, Daniele Rossi
:
Low power probabilistic online monitoring of systematic erroneous behaviour. ETS 2017: 1-2 - [c14]James R. B. Bantock
, Vasileios Tenentes
, Bashir M. Al-Hashimi, Geoff V. Merrett:
Online tuning of Dynamic Power Management for efficient execution of interactive workloads. ISLPED 2017: 1-6 - 2016
- [j6]Basel Halak
, Vasileios Tenentes
, Daniele Rossi
:
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. Microelectron. Reliab. 67: 74-81 (2016) - [j5]Daniele Rossi
, Vasileios Tenentes
, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi:
Reliable Power Gating With NBTI Aging Benefits. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2735-2744 (2016) - [c13]Hardeep Chahal
, Vasileios Tenentes
, Daniele Rossi
, Bashir M. Al-Hashimi:
BTI aware thermal management for reliable DVFS designs. DFT 2016: 1-6 - [c12]Mauricio D. Gutierrez, Vasileios Tenentes
, Tom J. Kazmierski:
Susceptible workload driven selective fault tolerance using a probabilistic fault model. IOLTS 2016: 115-120 - 2015
- [j4]Vasileios Tenentes
, S. Saqib Khursheed, Daniele Rossi
, Sheng Yang, Bashir M. Al-Hashimi:
DFT Architecture With Power-Distribution-Network Consideration for Delay-Based Power Gating Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 34(12): 2013-2024 (2015) - [c11]Daniele Rossi
, Vasileios Tenentes
, S. Saqib Khursheed, Bashir M. Al-Hashimi:
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating. ETS 2015: 1-6 - [c10]Vasileios Tenentes
, Daniele Rossi
, S. Saqib Khursheed, Bashir M. Al-Hashimi:
Diagnosis of power switches with power-distribution-network consideration. ETS 2015: 1-6 - [c9]Daniele Rossi
, Vasileios Tenentes
, S. Saqib Khursheed, Bashir M. Al-Hashimi:
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories. IOLTS 2015: 194-199 - 2014
- [c8]Vasileios Tenentes
, S. Saqib Khursheed, Bashir M. Al-Hashimi, Shida Zhong, Sheng Yang:
High Quality Testing of Grid Style Power Gating. ATS 2014: 186-191 - 2013
- [b1]Vasileios Tenentes:
Embedded testing architectures. University of Ioannina, Greece, 2013 - [j3]Vasileios Tenentes
, Xrysovalantis Kavousianos:
High-Quality Statistical Test Compression With Narrow ATE Interface. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32(9): 1369-1382 (2013) - 2011
- [j2]Xrysovalantis Kavousianos, Vasileios Tenentes
, Krishnendu Chakrabarty
, Emmanouil Kalligeros:
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets. IEEE Trans. Very Large Scale Integr. Syst. 19(12): 2330-2335 (2011) - [c7]Vasileios Tenentes
, Xrysovalantis Kavousianos:
Low Power Test-Compression for High Test-Quality and Low Test-Data Volume. Asian Test Symposium 2011: 46-53 - [c6]Vasileios Tenentes
, Xrysovalantis Kavousianos:
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs. ICCAD 2011: 747-754 - 2010
- [j1]Vasileios Tenentes
, Xrysovalantis Kavousianos, Emmanouil Kalligeros:
Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 29(10): 1640-1644 (2010) - [c5]Xrysovalantis Kavousianos, Krishnendu Chakrabarty
, Emmanouil Kalligeros, Vasileios Tenentes
:
Defect Coverage-Driven Window-Based Test Compression. Asian Test Symposium 2010: 141-146 - [c4]S. Balatsouka, Vasileios Tenentes
, Xrysovalantis Kavousianos, Krishnendu Chakrabarty
:
Defect aware X-filling for low-power scan testing. DATE 2010: 873-878 - [c3]Vasileios Tenentes, Xrysovalantis Kavousianos:
Self-Freeze Linear Decompressors for Low Power Testing. ISVLSI 2010: 63-68 - [c2]Vasileios Tenentes
, Xrysovalantis Kavousianos:
Self-Freeze Linear Decompressors: Test Pattern Generators for Low Power Scan Testing. ISVLSI (Selected papers) 2010: 217-230
2000 – 2009
- 2008
- [c1]Vasileios Tenentes
, Xrysovalantis Kavousianos, Emmanouil Kalligeros:
State Skip LFSRs: Bridging the Gap between Test Data Compression and Test Set Embedding for IP Cores. DATE 2008: 474-479
Coauthor Index

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