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K. G. Rajendran

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2000 – 2009

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2001
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K. G. Rajendran, Wim Schoenmaker:
Measurement and Simulation of Boron Diffusivity in Strained Si₁ -_xGe_x Epitaxial Layers. VLSI Design 13(1-4): 317-321 (2001)

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