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Wen-Shiang Liao

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2010 – 2019

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2018
[j2]
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  - journals/mr/TuanCWLWFL18
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  - https://dblp.org/rec/journals/mr/TuanCWLWFL18
Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan:
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. Microelectron. Reliab. 83: 260-270 (2018)

2000 – 2009

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2008
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Sheng-Yi Huang, Kun-Ming Chen, Guo-Wei Huang, Cheng-Chou Hung, Wen-Shiang Liao, Chun-Yen Chang:
Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors. Microelectron. Reliab. 48(2): 193-199 (2008)

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