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Atul Maheshwari
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2010 – 2019
- 2010
- [c6]David E. Duarte, Paola Zepeda, Suching Hsu, Atul Maheshwari, Greg Taylor:
HVM performance validation and DFM techniques used in a 32nm CMOS thermal sensor system. CICC 2010: 1-4
2000 – 2009
- 2007
- [j4]Atul Maheshwari, Wayne P. Burleson:
Current-Sensing and Repeater Hybrid Circuit Technique for On-Chip Interconnects. IEEE Trans. Very Large Scale Integr. Syst. 15(11): 1239-1244 (2007) - 2005
- [j3]Russell Tessier, David Jasinski, Atul Maheshwari, Aiyappan Natarajan, Weifeng Xu, Wayne P. Burleson:
An energy-aware active smart card. IEEE Trans. Very Large Scale Integr. Syst. 13(10): 1190-1199 (2005) - [c5]Aiyappan Natarajan, Vijay Shankar, Atul Maheshwari, Wayne P. Burleson:
Sensing Design Issues in Deep Submicron CMOS SRAMs. ISVLSI 2005: 42-45 - 2004
- [j2]Atul Maheshwari, Wayne P. Burleson, Russell Tessier:
Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 12(3): 299-311 (2004) - [j1]Atul Maheshwari, Wayne P. Burleson:
Differential current-sensing for on-chip interconnects. IEEE Trans. Very Large Scale Integr. Syst. 12(12): 1321-1329 (2004) - [c4]Vishak Venkatraman, Atul Maheshwari, Wayne P. Burleson:
Mitigating static power in current-sensed interconnects. ACM Great Lakes Symposium on VLSI 2004: 224-229 - 2003
- [c3]Atul Maheshwari, Israel Koren, Wayne P. Burleson:
Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits. DFT 2003: 597- - [c2]Atul Maheshwari, Wayne P. Burleson:
Repeater and current-sensing hybrid circuits for on-chip interconnects. ACM Great Lakes Symposium on VLSI 2003: 269-272 - 2002
- [c1]Atul Maheshwari, Wayne P. Burleson, Russell Tessier:
Trading off Reliability and Power-Consumption in Ultra-low Power Systems. ISQED 2002: 361-366
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