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Tsuyoshi Shinogi
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2010 – 2019
- 2010
- [j6]Kazumi Hatayama, Tsuyoshi Shinogi:
Foreword. IEICE Trans. Inf. Syst. 93-D(1): 1 (2010)
2000 – 2009
- 2008
- [c31]Hiroharu Kawanaka, Yujiro Shiroyama, Shinji Tsuruoka, Tsuyoshi Shinogi, Koji Yamamoto:
A Study on Document Structure Recognition of Discharge Summaries for Analogous Case Search System. Document Analysis Systems 2008: 423-430 - 2007
- [j5]Halpage Chinthaka Nuwandika Premachandra, Hiroharu Kawanaka, Tomohiro Yoshikawa, Shinji Tsuruoka, Tsuyoshi Shinogi:
A Study on Modeling Error Estimation for Mobile Robot Based on Coevolutionary Computation and Image Processing. J. Adv. Comput. Intell. Intell. Informatics 11(7): 825-832 (2007) - [c30]Hiroharu Kawanaka, Yoshihiro Otani, Koji Yamamoto, Tsuyoshi Shinogi, Shinji Tsuruoka:
Tendency discovery from incident report map generated by self organizing map and its development. SMC 2007: 2016-2021 - 2006
- [c29]Terumine Hayashi, Naotsugu Ikeda, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita:
Low Power Oriented Test Modification and Compression Techniques for Scan Based Core Testing. ATS 2006: 327-332 - 2005
- [j4]Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase:
On Test Data Compression Using Selective Don't-Care Identification. J. Comput. Sci. Technol. 20(2): 210-215 (2005) - [c28]Tsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa:
A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. Asian Test Symposium 2005: 366-371 - [c27]Yoshihiro Otani, Hiroharu Kawanaka, Tomohiro Yoshikawa, Koji Yamamoto, Tsuyoshi Shinogi, Shinji Tsuruoka:
Keyword Extraction from Incident Reports and Keyword Map Generation Method Using Self Organizing Map. SMC 2005: 1024-1029 - [c26]Yoshihiro Otani, Hiroharu Kawanaka, Tomohiro Yoshikawa, Koji Yamamoto, Tsuyoshi Shinogi, Shinji Tsuruoka:
Keyword Extraction from Incident Reports and Keyword Map Generation Method Using Self Organizing Map. SMC 2005: 1030-1035 - 2004
- [c25]Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase:
Test data compression technique using selective don't-care identification. ASP-DAC 2004: 230-233 - 2003
- [c24]Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka:
Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. Asian Test Symposium 2003: 268-273 - [c23]Miho Ohsaki, Yoshifumi Banno, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Nobuharu Tsuruoka:
Sampling point extraction based on genetic algorithm and function approximation of a search space. CIRA 2003: 300-305 - [c22]Hiroharu Kawanaka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka:
Constraints and search efficiency in nurse scheduling problem. CIRA 2003: 312-317 - [c21]Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka:
Acquisition of fuzzy rules for fire judgment system. CIRA 2003: 653-657 - [c20]Hiroharu Kawanaka, Tomohiro Yoshikawa, Yoshifumi Banno, Tsuyoshi Shinogi, Shinji Tsuruoka:
A study on territories by similarity of chromosomes for fitness inference method. SMC 2003: 3571-3576 - 2002
- [j3]Yoshifumi Banno, Tomohiro Yoshikawa, Hiroharu Kawanaka, Tsuyoshi Shinogi, Shinji Tsuruoka:
A Study on Deriving a Method for Chromosome Similarities Suitable for the Search Space. J. Adv. Comput. Intell. Intell. Informatics 6(3): 135-144 (2002) - [c19]Kosuke Yamamoto, Tomohiro Yoshikawa, Takeshi Furuhashi, Tsuyoshi Shinogi, Shinji Tsuruoka:
Evaluation of search performance of bacterial evolutionary algorithm. IEEE Congress on Evolutionary Computation 2002: 1343-1347 - [c18]Teruyuki Yamaguchi, Shinji Tsuruoka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Eiji Makimoto, Hisao Ogata, Malayappan Shridhar:
A segmentation system for touching handwritten Japanese characters. IWFHR 2002: 407-412 - [c17]Ryouji Minehara, Tomoki Matsumoto, Tsuyoshi Shinogi, Tomohiro Yoshikawa, Shinji Tsuruoka:
An Automatic Recording System of the Plays and Moves of SHOGI Games Using Image Processing Technique. MVA 2002: 52-55 - 2001
- [j2]Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
An enhanced fault model for high defect coverage. Syst. Comput. Jpn. 32(6): 36-44 (2001) - [c16]Tsuyoshi Shinogi, Tomokazu Kanbayashi, Tomohiro Yoshikawa, Shinji Tsuruoka, Terumine Hayashi:
Faulty Resistance Sectioning Technique for Resistive Bridging Fault ATPG Systems. Asian Test Symposium 2001: 76-81 - [c15]Hiroharu Kawanaka, Kosuke Yamamoto, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka:
Genetic algorithm with the constraints for nurse scheduling problem. CEC 2001: 1123-1130 - [c14]Kosuke Yamamoto, Hiroharu Kawanaka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka:
The effects of inactivation of rules for knowledge acquisition. CEC 2001: 1322-1326 - [c13]Shinji Tsuruoka, Toru Yamaguchi, Kenji Kato, Tomohiro Yoshikawa, Tsuyoshi Shinogi:
A Camera Control Based Fuzzy Behaviour Recognition of Lecturer for Distance Lecture. FUZZ-IEEE 2001: 940-943 - [c12]Shinji Tsuruoka, Toru Tanaka, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Kensuke Takao:
Region Segmentation for Table Image with Unknown Complex Structure. ICDAR 2001: 709-715 - [c11]Teruyuki Yamaguchi, Tomohiro Yoshikawa, Tsuyoshi Shinogi, Shinji Tsuruoka, Masato Teramoto:
A Segmentation Method for Touching Japanese Handwritten Characters Based on Connecting Condition of Line. ICDAR 2001: 837-843 - 2000
- [c10]Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi:
Cyclic greedy generation method for limited number of IDDQ tests. Asian Test Symposium 2000: 362- - [c9]Haruhiko Takase, Tsuyoshi Shinogi, Terumine Hayashi, Hidehiko Kita:
Evaluation Function for Fault Tolerant Multi-Layer Neural Networks. IJCNN (3) 2000: 521-526
1990 – 1999
- 1999
- [j1]Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki:
Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuits. Syst. Comput. Jpn. 30(7): 55-68 (1999) - [c8]Kai Zhang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi:
A Method for Evaluating Upper Bound of Simultaneous Switching Gates Using Circuit Partition. ASP-DAC 1999: 291-294 - [c7]Tsuyoshi Shinogi, Terumine Hayashi:
A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Asian Test Symposium 1999: 164- - 1998
- [c6]Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi:
On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. Asian Test Symposium 1998: 102-107 - [c5]Tsuyoshi Shinogi, Terumine Hayashi:
A Simple and Efficient Method for Generating Compact IDDQ Test Set for Bridging Fault. VTS 1998: 112-117 - 1997
- [c4]Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki:
Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. Asian Test Symposium 1997: 16-21 - 1992
- [c3]Kouichi Kumon, Akira Asato, Susumu Arai, Tsuyoshi Shinogi, Akira Hattori, Hiroyoshi Hatazawa, Kiyoshi Hirano:
Architecture and Implementation of PIM/p. FGCS 1992: 414-424
1980 – 1989
- 1988
- [c2]Tsuyoshi Shinogi, Kouichi Kumon, Akira Hattori, Atsuhiro Goto, Yasunori Kimura, Takashi Chikayama:
Macro-Call Instruction for the Efficient KL1 Implementation on PIM. FGCS 1988: 953-961 - 1985
- [c1]Mitsuhiro Kishimoto, Tsuyoshi Shinogi, Yasunori Kimura, Akira Hattori:
Design and Evaluation of a Prolog Compiler. LP 1985: 192-203
Coauthor Index
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