"Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL."

Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki (1997)

> Home

Details and statistics

DOI: 10.1109/ATS.1997.643908

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/ShinogiHT97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/ShinogiHT97
Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki:
Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. Asian Test Symposium 1997: 16-21

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.