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C. Besset

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2010 – 2019

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2019
[c1]
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Fatoumata Sy, Quentin Rafhay, Julien Poëtte, Gregory Grosa, C. Besset, Gaelle Beylier, Philippe Grosse, David Roy, Jean-Emmanuel Broquin:
Characterization and Modelling of High Speed Ge Photodetectors Reliability. IRPS 2019: 1-5

2000 – 2009

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2003
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C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent:
MIM capacitance variation under electrical stress. Microelectron. Reliab. 43(8): 1237-1240 (2003)

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