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Fabio Sureau

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2024
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Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche:
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach. J. Electron. Test. 40(3): 291-313 (2024)
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Esther Goudet, Luis Peña Treviño, Gutemberg G. dos Santos Júnior, Sayah El Hajji, Fabio Sureau, Lirida Naviner, Jean-Marc Daveau, Philippe Roche:
Drift of Combinational Circuits Failure Rates with a Probabilistic Model Approximated by Partitioning. SBCCI 2024: 1-5

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