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ORCIDJournal of Electronic Testing, Volume 40
Volume 40, Number 1, February 2024
- Vishwani D. Agrawal:
Editorial. 1-2 - 2023 JETTA Reviewers. 3-4
- Yuling Shang, Songyi Wei, Chunquan Li
, Xiaojing Ye, Lizhen Zeng, Wei Hu, Xiang He, Jinzhuo Zhou:
An End-to-End Mutually Exclusive Autoencoder Method for Analog Circuit Fault Diagnosis. 5-18 - Zhengfeng Huang, Zishuai Li, Liting Sun, Huaguo Liang, Tianming Ni, Aibin Yan:
A Quadruple-Node Upsets Hardened Latch Design Based on Cross-Coupled Elements. 19-30 - Shun-Hua Yang, Shi-Yu Huang:
General Fault and Soft-Error Tolerant Phase-Locked Loop by Enhanced TMR using A Synchronization-before-Voting Scheme. 31-43 - Hui Xu, Xuewei Qin, Ruijun Ma, Chaoming Liu, Shuo Zhu, Jun Wang, Huaguo Liang:
A High-Performance Quadruple-Node-Upset-Tolerant Latch Design and an Algorithm for Tolerance Verification of Hardened Latches. 45-60 - M. N. Saranya, Rathnamala Rao:
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems. 61-74 - Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-Induced Effects in FinFET SRAM Cells under Process Variations. 75-86 - Chen Dong, Xiao Chen, Zhenyi Chen:
Reactant and Waste Minimization during Sample Preparation on Micro-Electrode-Dot-Array Digital Microfluidic Biochips using Splitting Trees. 87-99 - Linsen Huang:
Analysis of the Lifecycles of Automotive Resistor Lead in Random Vibration. 101-106 - Shifeng Yu, Junjie Dai, Junhui Li:
Research on the Reliability of Interconnected Solder Joints of Copper Pillars under Random Vibration. 107-116 - Hala Ibrahim, Haytham Azmi, M. Watheq El-Kharashi, Mona Safar:
Non-Invasive Hardware Trojans Modeling and Insertion: A Formal Verification Approach. 117-135
Volume 40, Number 2, April 2024
- Vishwani D. Agrawal:
Editorial. 137-138 - Soham Roy, Spencer K. Millican, Vishwani D. Agrawal:
A Survey and Recent Advances: Machine Intelligence in Electronic Testing. 139-158 - Baojun Liu, Li Cai, Chuang Li:
An Analytical Model for Deposited Charge of Single Event Transient (SET) in FinFET. 159-169 - Rachana Ahirwar, Manisha Pattanaik, Pankaj Srivastava:
Radiation Hardened by Design-based Voltage Controlled Oscillator for Low Power Phase Locked Loop Application. 171-184 - Rongxing Cao, Yan Liu, Yulong Cai, Bo Mei, Lin Zhao, Jiayu Tian, Shuai Cui, He Lv, Xianghua Zeng, Yuxiong Xue:
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission. 185-197 - Alberto Bosio, Samuele Germiniani, Graziano Pravadelli, Marcello Traiola:
Syntactic and Semantic Analysis of Temporal Assertions to Support the Approximation of RTL Designs. 199-214 - Josie E. Rodriguez Condia, Juan-David Guerrero-Balaguera, Edward Javier Patiño Nuñez, Robert Limas Sierra, Matteo Sonza Reorda:
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs. 215-228 - Bahman Arasteh, Sahar Golshan, Shiva Shami, Farzad Kiani:
Sahand: A Software Fault-Prediction Method Using Autoencoder Neural Network and K-Means Algorithm. 229-243 - Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls:
A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. 245-257 - Bokka Raveendranadh, Sadasivam Tamilselvan:
Simulation-based Analysis of RPL Routing Attacks and Their Impact on IoT Network Performance. 259-273 - Ching-Yi Wen, Shi-Yu Huang:
Instant Test and Repair for TSVs using Differential Signaling. 275-287
Volume 40, Number 3, June 2024
- Vishwani D. Agrawal:
Editorial. 289 - Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche:
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach. 291-313 - Nikolaos Georgoulopoulos, Theodora Mamali, Alkis A. Hatzopoulos:
Design and Verification of a SAR ADC SystemVerilog Real Number Model. 315-328 - Adnan Rashid, Ayesha Gauhar, Osman Hasan, Sa'ed Abed, Imtiaz Ahmad:
Formal Verification of Universal Numbers using Theorem Proving. 329-345 - Tamizharasi Arthanari, P. Ezhumalai:
A Novel Framework For Optimal Test Case Generation and Prioritization Using Ent-LSOA And IMTRNN Techniques. 347-370 - Sandip Chakraborty, Archisman Ghosh, Anindan Mondal, Bibhash Sen:
Towards the Detection of Hardware Trojans with Cost Effective Test Vectors using Genetic Algorithm. 371-385 - Vipin Kumar, Jayanta Ghosh:
Phase Noise Analysis Performance Improvement, Testing and Stabilization of Microwave Frequency Source. 387-403 - Yuqi Pan, Huaguo Liang, Junming Li, Jinxing Qu, Zhengfeng Huang, Maoxiang Yi, Yingchun Lu:
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision. 405-415
Volume 40, Number 4, August 2024
- Vishwani D. Agrawal:
Editorial. 417-418 - Xingna Hou, Guanxiang Qin, Ying Lu, Mulan Yi, Shouhong Chen:
A Defect Detection Method of Mixed Wafer Map Using Neighborhood Path Filtering Clustering Algorithm. 419-433 - Manali Dhar, Chiradeep Mukherjee, Ananya Banerjee, Debasmita Manna, Saradindu Panda, Bansibadan Maji:
Predicting Energy Dissipation in QCA-Based Layered-T Gates Under Cell Defects and Polarisation: A Study with Machine-Learning Models. 435-455 - Jun Yuan, Yuyang Zhang, Liangrui Zhang, Shuaiqi Hou, Yukun Han:
ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions. 457-468 - S. K. Mouleeswaran, K. Ramesh, K. Manikandan, Vivek Yoganand Anbalagan:
Dynamic Smartcard Protection and SSELUR-GRU-Based Attack Stage Identification in Industrial IoT. 469-485 - Meena Panchore, Chithraja Rajan, Jawar Singh:
Investigation of Silicon Aging Effects in Dopingless PUF for Reliable Security Solution. 487-496 - Hiroshi Iwata, Kokoro Yamasaki, Ken-ichi Yamaguchi:
Verification and Validation with Prototype Chip Implemented with Layout Level Scan C-Elements. 497-508 - Shawkat Sabah Khairullah:
Formal Verification of a Dependable State Machine-Based Hardware Architecture for Safety-Critical Cyber-Physical Systems: Analysis, Design, and Implementation. 509-523 - Ahilan Appathurai, Anusha Gorantla, Gladys Kiruba, Asmaa A. Hamad, Mohamed M. Hassan, N. Venkatram, Sindhu T. V.:
Interleaved Counter Matrix Code in SRAM Memories for Continuous Adjacent Multiple Bit Upset Correction. 525-537 - Leiqing Zheng, Bahman Arasteh, Mahsa Nazeri Mehrabani, Amir Vahide Abania:
An Automatic Software Testing Method to Discover Hard-to-Detect Faults Using Hybrid Olympiad Optimization Algorithm. 539-556 - Gen Li, Wenhai Li, Tianzhu Wen, Weichao Sun, Xi Tang:
High-Dimensional Feature Fault Diagnosis Method Based on HEFS-LGBM. 557-572 - Basudev Saha, Bidyut Das, Vineeta Shukla, Mukta Majumder:
Pebble Traversal-Based Fault Detection and Advanced Reconfiguration Technique for Digital Microfluidic Biochips. 573-587
Volume 40, Number 5, October 2024
- Vishwani D. Agrawal:
Editorial. 589-590 - 2023 JETTA-TTTC Best Paper Award. 591-593
- Abdelrahman G. Qoutb, Jamil Kawa, Eby G. Friedman:
Test Modules for Enhanced Testability of Single Flux Quantum Integrated Circuits. 595-602 - Adel Mahmoud, M. Watheq El-Kharashi, Cherif R. Salama:
Generating Synthetic Layout Test Patterns using Deep Learning. 603-614 - Yibo Feng, Lu Sun, Jiarun Lu, Zhenxiao Li, Jin Tian, Yang Qiu:
Equivalent Circuit and Damage Threshold Study of Communication Interfaces under HEMP. 615-624 - Rachana Ahirwar, Manisha Pattanaik, Pankaj Srivastava:
Investigating and Improving the Performance of Radiation-Hardened SRAM Cell with the Use of Multi-Voltage Transistors. 625-644 - Gao Yunpeng, Zhang Rui, Yang Mingxu, Fahad Sabah:
YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards. 645-656 - Jiantao Zhang, Xinyu Shi, Dong Qu, Haida Xu, Zhengfang Chang:
PCB Defect Recognition by Image Analysis using Deep Convolutional Neural Network. 657-667 - Xueqin Wu, Yikai Chen, Zekai Wang, Chenming Tian, Zhonghua Shen:
Efficient Selective Image Fusion: A PCB Diagnosis Approach and Implementation. 669-678 - Qian Lin, Mei-qian Wang:
Reliability Analysis for a GaAs LNA with Temperature Stress. 679-687
Volume 40, Number 6, December 2024
- Vishwani D. Agrawal:
Editorial. 689 - C. Thangam, R. Manjith:
Advancing Low Power BIST Architecture with GAN-Driven Test Pattern Optimization. 691-705 - Xiaonian Wu, Jinlin Li, Runlian Zhang, Hailong Zhang:
A Novel Two-Stage Model Based SCA against secAES. 707-721 - Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles. 723-740 - Yanjiang Liu, Junwei Li, Pengfei Guo, Chunsheng Zhu, Junjie Wang, Jingxin Zhong, Lichao Zhang:
A Feature-Adaptive and Scalable Hardware Trojan Detection Framework For Third-party IPs Utilizing Multilevel Feature Analysis and Random Forest. 741-759 - N. Muthuram, S. Saravanan:
Fatigue Life Based Study of Electronic Package Mounting Locations on Printed Circuit Boards Subjected to Random Vibration Loads. 761-776 - Qiong Wu, Kaiming Hao, Wenfa Zhan:
A SLvT Adaptive Test Method for Integrated Circuit Test Parameter Sets without Yield Loss. 777-793 - Aswini Kumar Gadige, Paramesha:
Modeling and Parasitic Extraction of the MM9 Transistor for GHz/THz CMOS RF Circuit Design. 795-804
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