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Sang H. Baeg

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Journal Articles

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2018
[j2]
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  dblp key:
  - journals/mr/LiCNCWLCKSGBWW18
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  - https://dblp.org/rec/journals/mr/LiCNCWLCKSGBWW18
Yuanqing Li, Li Chen, Issam Nofal, Mo Chen, Haibin Wang, Rui Liu, Qingyu Chen, Milos Krstic, Shuting Shi, Gang Guo, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree. Microelectron. Reliab. 87: 24-32 (2018)
[j1]
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Haibin Wang, Xixi Dai, Yangsheng Wang, Issam Nofal, Li Cai, Zicai Shen, Wanxiu Sun, Jinshun Bi, Bo Li, Gang Guo, Li Chen, Sang H. Baeg:
A single event upset tolerant latch design. Microelectron. Reliab. 88-90: 909-913 (2018)

Conference and Workshop Papers

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2017
[c2]
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  - conf/iolts/NofalEHGLCLWCBW17
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Issam Nofal, Adrian Evans, Anlin He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, Haibin Wang, Mo Chen, Sang H. Baeg, Shi-Jie Wen, Richard Wong:
BPPT - Bulk potential protection technique for hardened sequentials. IOLTS 2017: 28-32
2004
[c1]
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  - conf/itc/JunCB04
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Hong Shin Jun, Sung Soo Chung, Sang H. Baeg:
Removing JTAG Bottlenecks in System Interconnect Test. ITC 2004: 173-180

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